Samsung Electronics Co., Ltd.

Shin-Chan Kang

Jae-Young Lee

Sun-Kyu Kim

Kyo-Keun Ku

Sun-Hee Park

A system on chip (Soc) includes a system bus, a plurality of sub-systems, an image processing logic block, an image memory interface and an image processing memory block. The sub-systems are respectively connected to the system bus. The image processing logic block is connected to the system bus. The image processing logic block performs an image processing. The image processing logic block is included in a first power domain. The image memory interface is connected to the system bus and the image processing logic block. The image processing memory block is connected to the image memory interface. The image processing memory block is used for the image processing. The image memory interface and the image processing memory block are included in a second power domain different from the first power domain.

System on chip including an image processing memory with multiple access

A semiconductor IC capable of debugging two or more processors at the same time using a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

Semiconductor IC incorporating a co-debugging function and test system

A wrapper circuit effectively converts a muxed-type memory (having time-multiplexed address and data lines) into a non-muxed type memory as seen by the controller (a non-muxed type memory controller). Wrapper circuit includes a select circuit (e.g., multiplexer) and an input/output buffer. The select circuit receives write data and an address from a non-muxed type memory controller and selects either the write data or the address according to a first control signal. The input/output buffer receives the selection among the write data and the address and passes the write data or the address to a muxed type memory. The input/output buffer also passes read data received from the memory to the memory controller.

Wrapper circuit and method for interfacing between non-muxed type memory controller and muxed type memory

A bus system, which may prevent data from being incorrectly transferred when an early termination occurs during a burst mode, may include a bus, for example, an advanced high-performance bus (AHB), at least one bus master device, a bus arbiter and at least one transfer mode selection circuit. The at least one bus master device may generate a burst cycle control signal, a transfer start signal and a bus control request signal for requesting control of the bus, and may be activated in response to a bus control grant signal, so as to exchange data via the bus. The bus arbiter may generate the bus control grant signal in response to the bus control request signal and provide the bus control grant signal to the bus master device. The at least one transfer mode selection circuit may convert a burst mode into a single mode to generate a selection signal, when the bus control grant signal is deactivated before a burst mode operation is completed.

Bus system and method of burst cycle conversion

A semiconductor IC capable of debugging two or more processors at the same time by means of a single debugger and a semiconductor IC test system. The semiconductor IC includes processors operating at different frequencies, a trigger circuit which causes all of the processors to be in a debugging state when one of the processors is in the debugging state, and a JTAG circuit applying a boundary scan operation to the processors connected to a JTAG pin in series.

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Seoul, South Korea

Shin-Chan Kang