Instrumental, Inc.

Shilpi Kumar

Anna-Katrina Shedletsky

Samuel Bruce Weiss

Simon Kozlov

Isaac Sukin

Tilmann Bruckhaus

Ian Theilacker

Brendan Green

One variation of a method for monitoring manufacture of assembly units includes: receiving selection of a target location hypothesized by a user to contain an origin of a defect in assembly units of an assembly type; accessing a feature map linking non-visual manufacturing features to physical locations within the assembly type; for each assembly unit, accessing an inspection image of the assembly unit recorded by an optical inspection station during production of the assembly unit, projecting the target location onto the inspection image, detecting visual features proximal the target location within the inspection image, and aggregating non-visual manufacturing features associated with locations proximal the target location and representing manufacturing inputs into the assembly unit based on the feature map; and calculating correlations between visual and non-visual manufacturing features associated with locations proximal the target location and the defect for the set of assembly units.

Method for monitoring manufacture of assembly units

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Palo Alto, CA, United States of America

Shilpi Kumar