Nanjing University of Aeronautics and Astronautics

Shilong Pan

Min Xue

Yuqing Heng

Jiang Liu

Wenquan Che

Li Wei

Shupeng Li

Wenjuan Chen

Wanchen Yang

Jinghao Li

Xiangchuan Wang

Dan Zhu

Chenxu Xie

Ting Qing

Lihan Wang

The provided is a germanium telluride-based reflectarray element and millimeter-wave frequency-reconfigurable reflectarray antenna. The reflectarray antenna includes a plurality of reflectarray elements, a dielectric substrate, a metal ground, and a feed source, where the reflectarray element is located on an upper surface of the dielectric substrate, and includes a loop body and two phase delay lines; two first germanium telluride films are embedded in the loop body to divide the loop body into two parts with equal lengths; each part of the loop body is connected to a middle portion of one phase delay line; two second germanium telluride films are embedded in the phase delay line; the two second germanium telluride films are symmetrically distributed up and down with the middle portion of the phase delay line as a center.

Germanium telluride-based reflectarray element and millimeter-wave frequency-reconfigurable reflectarray antenna

An apparatus includes a signal modulator configured to receive a radio frequency (RF) input signal having frequency bands and spanning a first frequency range within a second frequency range, and provide down-converted signals by converting each frequency band of the RF input signal down to a target frequency range. The apparatus further includes digital RF memories (DRFMs) configured to provide intermediate interfering signals by modulating at least one of the down-converted signals, and an interfering signal generator configured to provide up-converted signals by converting the intermediate interfering signals collectively up to a third frequency range, wherein the third frequency range is within the second frequency range, and provide an interfering RF output signal by combining the up-converted signals, wherein the interfering RF output signal spans the third frequency range.

Method and apparatus for processing radio frequency input signals and providing interfering radio frequency output signals

An apparatus comprises an optical signal generator configured to provide a first radiation comprising a first nominal carrier frequency and a second nominal carrier frequency, and provide a second radiation comprising a third nominal carrier frequency and a fourth nominal carrier frequency; an optical to electrical converter coupled to the optical signal generator and configured to: generate a first electrical current based on the first radiation and the second radiation without the second radiation passing through the Device under Test (DUT); and generate a second electrical current based on the first radiation and the second radiation after the second radiation passes through the DUT; and a data processor configured to determine a transfer function of the DUT at the third nominal carrier frequency and the fourth nominal carrier frequency based on the first electrical current and the second electrical current.

Method and system for optical vector analysis based on double-sideband modulation

An apparatus comprises an optical detecting signal generator configured to provide an optical spectrum comprising two frequency carriers, the two frequency carriers having two different nominal carrier frequencies, and the output port of the optical detecting signal generator being further configured to be coupled to a device under test (DUT); an optical to electrical converter configured to generate a first electrical current based on the optical spectrum without the optical spectrum passing through the DUT; and generate a second electrical current based on the optical spectrum after the optical spectrum passes through the DUT; and a data processor coupled to the optical to electrical converter, the data processor being configured to determine a transfer function of the DUT at an average of the two different nominal carrier frequencies based on the first electrical current and the second electrical current.

Method and system for optical vector analysis

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Jiangsu, China

Shilong Pan