Canon Kabushiki Kaisha

Shiki Takabayashi

Hiroshi Yoshikawa

Tetsuri Sonoda

According to the invention, reliability is calculated in consideration of an uncertain error due to noise in three-dimensional measurement, thereby obtaining correct reliability as compared with a conventional technique. To achieve this, a three-dimensional measuring apparatus includes a projector which projects a striped light pattern onto an object, a camera which captures a reflected light pattern from the object onto which the striped light pattern is projected, and a calculation processing unit which executes various arithmetic operations. The calculation processing unit includes a noise calculating unit and a reliability calculating unit.

Three-dimensional measuring apparatus and control method therefor

A pattern light projection unit which stores information on pattern light including information on line patterns projects pattern light including line patterns having at least two lines and at least one reference line pattern serving as a reference of the line patterns on an object in accordance with the information on pattern light. An image pickup unit captures an image of the object to which the pattern light is projected. An information processing apparatus detects the reference line pattern and the line patterns from the captured image, and establishes correspondence between the information on the line patterns stored in the pattern light projection unit and the line patterns detected from the captured image in accordance with the topological positional relationship between the detected reference line pattern and the line patterns so as to identify the line patterns.

Information processing apparatus, information processing method, and computer-readable storage medium

Information processing apparatus, information processing method, and a computer-readable storage medium

A three-dimensional measurement apparatus includes a detection unit configured to detect, in an image captured by a capture unit, position information of a pattern on a capture pixel surface, which is projected to a plurality of pattern detection areas preset on the same plane in a measurement space, and a corresponding relationship calculation unit configured to calculate, using the position information, a corresponding relationship between the pattern on a projection pixel surface of a projection unit detected in advance before measurement and the pattern on the projection pixel surface of the projection unit at the time of measurement.

Three-dimensional measurement apparatus, three-dimensional measurement method, and storage medium

A measuring apparatus includes a projection control unit configured to cause a projection unit to project, onto an object, a first light pattern with light and dark portions, a second light pattern, which is smaller in distance between the light and dark portions than that of the first light pattern and has a boundary position between the light and dark portions common to the first light pattern, and a third light pattern in which the light and dark portions of the second light pattern are reversed to each other, an acquisition unit configured to acquire a first captured image of the object onto which the first light pattern is projected, a second captured image of the object onto which the second light pattern is projected, and a third captured image of the object onto which the third light pattern is projected, and a calculation unit configured to calculate the boundary position between the light and dark portions of the first captured image based on the second and the third captured image to measure the position of the object.

Measuring apparatus, measuring method, and program

A three-dimensional measurement apparatus includes a projection unit configured to project a plurality of types of stripe pattern light. The projection unit projects stripe pattern light, which can be obtained by shifting stripe pattern light whose reliability calculated by the calculation unit is equal to or greater than a threshold value by a predetermined cycle, on the object.

Three-dimensional measurement apparatus, three-dimensional measurement method, and computer-readable medium storing control program

A three-dimensional measurement apparatus for calculating three-dimensional shape information of a target object, comprising: capturing means for capturing reflected pattern light of stripe pattern light formed by alternately arranging a bright portion and a dark portion as first image data, and capturing reflected pattern light of reversed stripe pattern light formed by reversing the bright portion and the dark portion of the stripe pattern light as second image data; determination means for determining a boundary position between the bright portion and the dark portion based on the first image data and the second image data; and reliability calculation means for calculating a reliability indicating accuracy of the boundary position from a correlation between a first luminance gradient of the first image data and a second luminance gradient of the second image data.

A moving image reproducing apparatus that does not inform the occurrence of any high light scene when high light scenes occur respectively in the images displayed in a main picture and a sub picture, and a control method of the moving image reproducing apparatus are provided. It can be determined whether the image displayed in the main picture is the high light scene or not when the image displayed in the sub picture is the high light scene, by detecting the high light scenes displayed respectively in the main picture and the sub picture. If the image displayed in the main picture is also the high light scene when the image displayed in the sub picture becomes the high light scene, then the control of not informing a viewer of the occurrence of the high light scene of the image displayed in the sub picture is performed.

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Tokyo, Japan

Shiki Takabayashi