Taiwan Semiconductor Manufacturing Comp. Ltd.

Shih-Liang Wang

Shih-Lien Linus Lu

Yu-Der Chih

Jonathan Tsung-Yung Chang

Cheng-En Lee

Kun-Hsi Li

Chien-Jung Wang

Chao-Hao Cheng

Systems and methods of generating a security key for an integrated circuit device include generating a plurality of key bits with a physically unclonable function (PUF) device. The PUF can include a random number generator that can create random bits. The random bits may be stored in a nonvolatile memory. The number of random bits stored in the nonvolatile memory allows for a plurality of challenge and response interactions to obtain a plurality of security keys from the PUF.

Integrated circuit (IC) signatures with random number generator and one-time programmable device

A method and apparatus is provided for stress testing integrated circuits to determine their susceptibility to hot carrier charge injection damage. The system includes a hot carrier injection source formed on a semiconductor wafer carrying the ICs under test. The carrier source comprises an adjustable, voltage controlled oscillator having a variable frequency AC output test signal, and a modulator circuit for varying the duty cycle of the test signal applied to the ICs.

Method and apparatus for stress testing integrated circuits using an adjustable AC hot carrier injection source

Growing community of inventors

Hsinchu, Taiwan

Shih-Liang Wang