Test Research, Inc.

Shih-Liang Chen

Yu-Che Cheng

Chia-Ho Yen

Kuang Pu Wen

Meng Kun Lee

Chih-Pin Chiu

An inspection system includes an irradiation source, an image detector, and a placement device. The placement device comprises a carrier and a rotation mechanism. With respect to connections, the placement device is configured to be disposed between the irradiation source and the image detector, and the rotation mechanism is configured to be connected to the carrier. With respect to operations, the irradiation source and the image detector are driven to be moved along a predetermined path, the carrier is configured to carry at least one object, and the rotation mechanism is configured to rotate the carrier.

Inspection system and method for controlling the same

A laminography inspection system comprises an irradiation source, a plurality of linear image detectors defining an image plane, a fixed table for placement of a test object in a stationary position between the irradiation source and the image detectors, and a computing device for processing a plurality of images of the test object acquired from the image detectors. The irradiation source and the image detectors perform a plurality of parallel linear scanning passes across the area of the test object to acquire images of the test object under different viewing angles. Based on the acquired image data, the computing device determines a warp compensation and generates a cross-sectional image of a selected section within the test object.

Growing community of inventors

Taipei, Taiwan

Shih-Liang Chen