Lite-on Technology Corporation

Phison Electronics Corporation

Lite-on Electronics (guangzhou) Limited

Solid State Storage Technology Corporation

Shih-Jia Zeng

Jen-Chien Fu

Wei Hung Lin

Tsu-Han Lu

Hsie-Chia Chang

Kuan-Chun Chen

Yu-Cheng Hsu

Yu-Siang Yang

Chih-Wei Wang

Hsiao-Yi Lin

Chun-Wei Tsao

Hsiao-Chang Yen

Chien-Fu Tseng

Po-Cheng Su

Chun-Wei Kuo

Yu-Shan Wu

Yen-Yu Chou

Chen-An Hsu

Chen Yang Tang

Yu-Hsiang Lin

Szu-Wei Chen

An-Cheng Liu

Lih Yuarn Ou

Po-Hao Chen

Yi-Fang Chang

Shi-Chieh Hsu

Ding-Chiuan Huang

The present disclosure provides a memory management method, a memory storage apparatus and a memory control circuit unit. The method includes: performing a first operation on a plurality of physical units to obtain a quality estimation parameter corresponding to the physical units; establishing a check list according to the quality estimation parameter, wherein the check list records index information of a first physical unit among the physical units, and a number of the first physical unit is less than a total number of the physical units; and in response to a default condition being satisfied, performing a status scanning on the first physical unit according to the index information in the check list.

Memory management method, memory storage apparatus and memory control circuit unit

A decoding parameter updating method, a memory storage device, and a memory control circuit unit are provided. The method includes: sending a read command sequence to a rewritable non-volatile memory module to instruct to read first data from a first physical unit based on multiple read voltage levels; decoding the first data according to multiple decoding parameters to obtain second data, wherein the decoding parameters respectively correspond to multiple voltage intervals, and the voltage intervals are defined by the read voltage levels; obtaining first error evaluation information corresponding to a first voltage interval among the voltage intervals according to the first data and the second data; and updating a first decoding parameter corresponding to the first voltage interval according to the first error evaluation information.

Decoding parameter updating method, memory storage device, and memory control circuit unit

A data accessing method, a memory controlling circuit unit, and a memory storage device are provided. The method includes: reading a codeword stored in a physical programming unit, and calculating a bit change ratio of a bit value change in dummy data included in the codeword; adjusting a read voltage level or a log likelihood ratio according to the bit change ratio; and performing a decoding operation on the codeword by using the adjusted read voltage level or the adjusted log likelihood ratio.

Method for adjusting a read voltage level or log likelihood ratio of a memory based on a calculated bit change ratio, memory controlling circuit unit, and memory storage device

A voltage calibration method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: reading first data from a first physical unit using a first read voltage level and reading second data from at least one second physical unit using a second read voltage level; obtaining count information reflecting a total number of memory cells meeting a default condition in the first physical unit and the at least one second physical unit according to the first data and the second data; and calibrating the first read voltage level according to the count information.

Voltage calibration method, memory storage device and memory control circuit unit

A read voltage adjustment method, a memory storage device, and a memory control circuit unit are disclosed. The method includes: sending a write command sequence instructing to program a plurality of first memory cells in a rewritable non-volatile memory module; sending a first read command sequence instructing to read the programmed first memory cells using a first read voltage level to obtain first count information; obtaining first compensation information corresponding to the first read voltage level, wherein the first compensation information reflects a deviation in evenly programming the first memory cells to a plurality of states; and adjusting the first read voltage level according to the first count information, the first compensation information, and default count information corresponding to the first read voltage level.

Read voltage adjustment method, memory storage device and memory control circuit unit

An exemplary embodiment of the invention provides a read voltage control method for a rewritable non-volatile memory module. The method includes: sending a first read command sequence which instructs a reading of a plurality of first memory cells by using a first voltage level to obtain first data; obtaining first adjustment information of a read voltage according to the first data and a channel parameter of the first memory cells, and the channel parameter reflects a channel status of the first memory cells; and adjusting a voltage level of the read voltage from the first voltage level to a second voltage level according to the first adjustment information.

Read voltage control method, memory storage device and memory control circuit unit

A read voltage level correction method, a memory storage device, and a memory control circuit unit are provided. The method includes: using a first read voltage level as an initial read voltage level to perform a first data read operation on a first physical unit among multiple physical units to obtain a second read voltage level used to successfully read the first physical unit; recording association information between the first read voltage level and the second read voltage level in a transient look-up table; and performing a second data read operation according to a read level tracking table and the association information recorded in the transient look-up table.

Read voltage level correction method, memory storage device, and memory control circuit unit

A decoding method, a memory storage device and a memory control circuit unit are disclosed. The method includes: activating a decoding circuit which supports a plurality of decoding modes each corresponding to a threshold value, wherein a distribution of the threshold value corresponds to error correction abilities of the decoding modes; reading first data from a rewritable non-volatile memory module; performing, by the decoding circuit, a first decoding operation on the first data; obtaining a decoding parameter according to an execution result of the first decoding operation; and performing, by the decoding circuit, a second decoding operation on the first data based on a first decoding mode among the decoding modes according to a relative numerical relationship between the decoding parameter and the threshold value.

Decoding method, memory storage device and memory control circuit unit

A read disturb checking method, a memory storage device, and a memory control circuit unit are provided. The method includes: updating first and second read counts of a first physical unit group according to a total read count of a read operation performed on physical programming units in the first physical unit group; scanning at least one first physical programming unit in a currently read physical erasing unit in response to determining the first read account is greater than a first read count threshold to obtain a first error bit amount; scanning all physical programming units in at least one first physical erasing unit in the first physical unit group in response to determining the second read account is greater than a second read count threshold to obtain a second error bit amount; performing a read disturb prevention operation according to the first or second error bit amount.

Read disturb checking method, memory storage device and memory control circuit unit

A memory control method, a memory storage device and a memory control circuit unit are provided. The method includes: determining a retry threshold value according to decoding history information which includes information related to at least one first decoding operation previously performed; and determining whether to enter a second decoding mode according to the retry threshold value after at least one second decoding operation performed based on a first decoding mode is failed. A decoding ability of the second decoding mode is higher than a decoding ability of the first decoding mode.

Memory control method, memory storage device and memory control circuit unit

A memory control method, a memory storage device, and a memory control circuit unit are provided. The memory control method includes: reading multiple first memory cells using multiple read voltage levels to obtain a first threshold voltage distribution of the first memory cells; obtaining shift information of the first threshold voltage distribution with respect to an original threshold voltage distribution of the first memory cells; obtaining first reliability information corresponding to the first threshold voltage distribution; recovering original reliability information corresponding to the original threshold voltage distribution according to a statistical characteristic of the first reliability information; adjusting the original reliability information according to the shift information to obtain second reliability information corresponding to the first threshold voltage distribution; and updating reliability information related to the first memory cells according to the second reliability information.

Memory control method, memory storage device, and memory control circuit unit

A memory control method for a rewritable non-volatile memory module is provided according to an exemplary embodiment of the disclosure. The method includes: sending a first read command sequence which indicates a reading of a first physical unit by using a first read voltage level to obtain first data; decoding the first data; sending a second read command sequence which indicates a reading of the first physical unit by using a second read voltage level to obtain second data; decoding the second data with assistance information to improve a decoding success rate of the second data if the second read voltage level meets a first condition or the second data meets a second condition; and decoding the second data without the assistance information if the second read voltage level does not meet the first condition and the second data does not meet the second condition.

A solid state storage device using a prediction function is provided. The solid state storage device includes a control circuit and a non-volatile memory. The control circuit generates collection read operation commands. The collection read operation commands are temporarily stored in a command queue, and transmitted to the non-volatile memory. According to each of the collection read operation commands, the non-volatile memory generates a corresponding encoded read data to the control circuit. After the error correction circuit performs a decoding operation on the encoded read data, a decoded content is generated and a first count of the decoded content is transmitted to a first register of the register set. After the encoded read data is decoded, a value stored in the first register is a first parameter and the first parameter is inputted into a prediction function of the function storage circuit.

Solid state storage device using prediction function

A solid state storage device includes a non-volatile memory and a control circuit. The non-volatile memory includes a specified region. The control circuit is connected with the non-volatile memory, and includes a function storage circuit. A state prediction function for a first failure mode and a state prediction function for a second failure mode are stored in the function storage circuit. If the control circuit confirms that the specified region is changed from the first failure mode to the second failure mode, the control circuit predicts the specified region according to current state parameters of the specified region and the state prediction function for the second failure mode.

Solid state storage device using state prediction method

A failure mode detection method is provided. A first default read voltage is changed to a first read retry voltage by a first increment, and a second default read voltage is changed to a second read retry voltage by a second increment. A memory cell array of a solid state storage device is successfully read according to the first and second read retry voltages. If an absolute value of the first increment minus an absolute value of the second increment is larger than a predetermined voltage value, the memory cell array is in a data retention failure mode. If the absolute value of the first increment minus the absolute value of the second increment is smaller than the predetermined voltage value, the memory cell array is in a low temperature write high temperature read failure mode.

Growing community of inventors

Taipei, Taiwan

Shih-Jia Zeng