Realtek Semiconductor Inc.

Realtek Semiconductor Corporate

Shih-Hsiung Huang

Chih-Lung Chen

Liang-Huan Lei

Jie-Fan Lai

Chien-Ming Wu

Yu-Chang Chen

Liang-Wei Huang

Kai-Yin Liu

Wei-Jyun Wang

Kai-Yue Lin

Ying-Cheng Wu

Jian-Ru Lin

Wei-Chou Wang

Sheng-Hsiung Lin

Kuo-Sheng Chung

Hsuan-Ting Ho

Sheng-Yen Shih

Chun-Hsiung Chang

Chih-Chieh Yang

Sheng Hsiung Lin

Shun-Ta Wu

Pan Zhang

Cheng-Hui Wu

Yu-Xuan Huang

Che-Wei Chang

Chih-Chien Chang

Yun-Tse Chen

Cheng-Pang Chan

Tai-Cheng Lee

Yan-Guei Chen

Chung-Ming Tseng

Chi-Ying Lee

Xiao-Bo Zhou

Chia-Min Li

Tzu-Hao Hung

Chi-Sheng Hsu

Tsung-Chen Wu

Tung-Hung Sung

The present invention discloses an analog to digital conversion (ADC) apparatus having quick conversion mechanism. Each of ADC circuits receives a previous higher-bit conversion result to perform prediction to generate a current higher-bit conversion result, performs conversion on an input analog signal according to a sampling clock that has a frequency at least twice of the frequency of the input analog signal based on a successive-approximation mechanism to generate a current lower-bit conversion result, and combines the current higher-bits and current lower-bit conversion results to generate a current conversion result and output a remained signal amount as a residue. A noise-shaping circuit performs calculation based on the residue to generate a noise-shaping reference signal. Each of the ADC circuits combines the current conversion result and the noise-shaping reference signal to generate an output digital signal.

Analog to digital conversion apparatus and method having quick conversion mechanism

A semiconductor capacitor array layout includes a first conductive structure and a second conductive structure. The first conductive structure includes: longitudinal first conductive strips in a first integrated circuit (IC) layer; and lateral first conductive strips that are in a second IC layer and coupled to the longitudinal first conductive strips. The longitudinal and lateral first conductive strips jointly form well-shaped structures including outer wells and inner wells. The outer wells are not electrically coupled to the inner wells. The second conductive structure includes second conductors that are respectively disposed in the well-shaped structures in the first IC layer. The second conductors include outer second conductors respectively positioned in the outer wells and inner second conductors respectively positioned in the inner wells. The outer second conductor are not electrically coupled to the inner second conductor. The outer wells and the outer second conductors jointly function as a dummy capacitor structure.

Semiconductor capacitor array layout with dummy capacitor structure

A semiconductor capacitor array layout generates parasitic capacitance toward an edge of the layout so as to reduce a capacitance difference between an outer capacitor unit and an inner capacitor unit. The semiconductor capacitor array layout includes a first conductive structure and a second conductive structure. The first conductive structure includes: longitudinal first conductive strips disposed in a first integrated circuit (IC) layer; and lateral first conductive strips disposed in a second IC layer. The longitudinal and lateral first conductive strips jointly form well-type structures including outer wells and inner wells that are electrically connected. The second conductive structure includes second conductors disposed in the first IC layer. The second conductors include outer conductors and inner conductors that are electrically disconnected and respectively disposed in the outer wells and the inner wells. The outer wells and the closest inner conductors jointly generate parasitic capacitance.

Semiconductor capacitor array layout capable of generating parasitic capacitance toward edge of layout

A charge-steering amplifier circuit and a control method thereof are provided. The charge-steering amplifier circuit is used for amplifying a differential input signal and includes a sample-and-hold circuit, a charge-steering amplifier, a reference voltage generation circuit, and a switch circuit. The sample-and-hold circuit is configured to sample the differential input signal to generate first and second sampled signals. The charge-steering amplifier has a first input terminal, a second input terminal, a first output terminal, and a second output terminal. The first and second input terminals receive the first and second sampled signals, respectively. The reference voltage generation circuit is configured to generate a reference voltage according to the differential input signal. The switch circuit is configured to couple the reference voltage to the first output terminal and the second output terminal.

Charge-steering amplifier circuit and control method thereof

A comparison control circuit is adapted to analog-to-digital converters and low-dropout regulators. The comparison control circuit includes a comparator, a Schmitt trigger, a capacitor set and a logic circuit. The comparator is configured to output a comparison signal according to a first input signal and a second input signal, wherein the comparison signal is a first high voltage potential or a first low voltage potential. The Schmitt trigger is configured to output a trigger signal according to the comparison signal and a voltage potential range, wherein the voltage potential range is in a range from the first low voltage potential to the first high voltage potential. The capacitor set is configured to adjust the second input signal when being controlled. The logic circuit is configured to control the capacitor set according to the trigger signal to correspondingly adjust the second input signal.

Analog-to-digital converter, low-dropout regulator and comparison control circuit thereof

The present invention discloses a DAC method having signal calibration mechanism. A first conversion circuit generates a first analog signal according to an input digital signal. A second conversion circuit generates a second analog signal according to the input digital signal and a pseudo-noise digital signal. An echo transmission circuit processes a signal on an echo path to generate an echo signal. A first and a second calibration circuits generate a first and a second calibration signals. A calibration parameter calculation circuit performs calculation according to a difference between the echo signal and a sum of the first and the second calibration signals and related path information to generate a first and a second offsets. The first and the second calibration circuits converge first and second response coefficients and update a first and a second codeword offset tables according to the first and the second offsets.

Digital-to-analog conversion apparatus and method having signal calibration mechanism

A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into a plurality of first digital codes, in which a first converter circuitry in the converter circuitries is configured to perform a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate control signals, and determines whether to set the second digital code to be a second corresponding digital code in predetermined digital codes according to the control signals.

Pipeline analog to digital converter and signal conversion method

The present disclosure discloses a switched capacitor amplifier apparatus for improving level-shifting. An amplifier includes input terminals and output terminals. Two capacitor circuits correspond to signal input terminals and signal output terminals and each includes a sampling capacitor circuit, a load capacitor and a level-shifting capacitor. The sampling capacitor circuit samples an input signal from one of the signal input terminals to one of the input terminals. An electrical charge neutralizing capacitor is coupled between the output terminals. The load capacitor and the level-shifting capacitor are charged according to an output from one of the output terminals in an estimation period. The level-shifting capacitor charges the load capacitor in a level-shifting period to generate an output signal at one of the signal output terminals. The electrical charge neutralizing capacitor receives and provides electrical charges from the output terminals to the level-shifting capacitor respectively in the estimation period and the level-shifting period.

Switched capacitor amplifier apparatus and switched capacitor amplifying method for improving level-shifting

An analog-to-digital converter, configured to convert an input signal into an n bits digital output signal, includes a capacitor module, a control signal generation unit, a comparator, and a register. The capacitor module is configured to receive the input signal at a sampling phase in a normal mode, and to generate a first sampling signal and a second sampling signal according to the input signal in a conversion phase. The control signal generation unit is configured to adjust the first sampling signal or the second sampling signal in the conversion phase. In the normal mode, the comparator is configured to compare the first sampling signal and the second sampling signal in the conversion phase to generate n comparison signals. The register is configured to store the n comparison signals as the digital output signal, and output the digital output signal in the normal mode.

Analog-to-digital converter and method thereof

A time-interleaved analog to digital converter includes capacitor array circuits, at least one successive approximation register circuitry, and at least one noise shaping circuitry. The capacitor array circuits are configured to alternately sample an input signal, in order to generate a sampled input signal. The at least one successive approximation register circuitry is configured to perform an analog to digital conversion according to the sampled input signal and a residue signal, in order to generate at least one digital output. The at least one noise shaping circuitry is configured to utilize at least one first circuit in switched-capacitor circuits to transfer the residue signal from a first capacitor array circuit in the capacitor array circuits, and randomly select at least one second circuit from the switched-capacitor circuits to cooperate with a second capacitor array circuit in the capacitor array circuits to sample the input signal.

Time-interleaved analog to digital converter having randomization and signal conversion method

An analog-to-digital converter includes a switch circuit, a first capacitor array, a second capacitor array and a comparator. A method of operating the analog-to-digital converter includes switching a swap signal to a first level in a first sampling period for the switch circuit to couple the first capacitor array to a first input terminal of the comparator and a first signal source, and couple the second capacitor array to a second input terminal of the comparator and a second signal source, and switching the swap signal to a second level in a second sampling period for the switch circuit to couple the first capacitor array to the second input terminal of the comparator and the second signal source, and couple the second capacitor array to the first input terminal of the comparator and the first signal source.

Analog-to-digital converter capable of reducing nonlinearity and method of operating the same

A method of operating an analog-to-digital converter includes in a first conversion period, a comparator generating a first comparison result, a first selection circuit switching a voltage output to a first capacitor of a set of larger capacitor of a first capacitor array, and a second selection circuit switching a voltage output to a second capacitor of a set of larger capacitor of a second capacitor array, and in a second conversion period after the first conversion period, the comparator generating a second comparison result different from the first comparison result, the first selection circuit switching back the voltage output to a first capacitor portion of the first capacitor of the set of larger capacitor of the first capacitor array, and the second selection circuit switching back the voltage output to a first capacitor portion of the second capacitor of the set of larger capacitor of the second capacitor array.

Method of operating analog-to-digital converter by reversed switching technique and analog-to-digital converter utilizing same

A bootstrapped switch includes a first transistor, a second transistor, a first capacitor, three switches, and a switch circuit. The switch circuit includes a first switch, a second switch, a second capacitor, and an inverter circuit. The first transistor receives the input voltage and outputs the output voltage. The first terminal of the second transistor receives the input voltage, and the second terminal of the second transistor is coupled to the first terminal of the first capacitor. The control terminal of the first switch receives a clock. The first switch is coupled between a node and a reference voltage. The second switch is coupled between the control terminal of the first transistor and the node. The input terminal of the inverter circuit is coupled to the control terminal of the first switch. The second capacitor is coupled between the node and the output terminal of the inverter circuit.

Bootstrapped switch

Disclosed is a voltage reference buffer circuit including a first, second, third, and fourth bias generators and a first, second, third, and fourth driving components. The first, second, third, and fourth bias generators generate bias voltages to control the first, second, third, and fourth driving components respectively. The first, second, third, and fourth driving components are coupled in sequence, wherein the first and second driving components are different types of transistors and jointly output a first reference voltage, the third and fourth driving components are different types of transistors and jointly output a second reference voltage, and the group of the first and second driving components is separated from the group of the third and fourth driving components by a resistance load.

Voltage reference buffer circuit

A transmitter device includes a transmitter circuit, a voltage generator circuit, and a calibration circuit. The transmitter circuit is configured to selectively operate in a calibration mode or a normal mode in response to a first control signal, in which the transmitter circuit has a first output terminal and a second output terminal. The voltage generator circuit is configured to generate a bias voltage, in which the bias voltage has a first level in the calibration mode and has a second level in the normal mode, and the first level is different from the second level. The calibration circuit is configured to be turned on in the calibration mode according to the bias voltage and a second control signal, in order to calibrate a level of the first output terminal and a level of the second output terminal.

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Miaoli County, Taiwan

Shih-Hsiung Huang