United Microelectronics Corp.

Shih-Hao Su

Shih-Chieh Hsu

Chi-Horn Pai

Shao-Hua Hsu

Zen-Jay Tsai

Ying-Hung Chou

Shui-Yen Lu

Chun-Chia Chen

Chih-Chung Chen

Hung-Yi Wu

Chih-Ho Wang

A method for fabricating a semiconductor device is described. A gate layer, a C-doped first protective layer and a hard mask layer are formed on a substrate and then patterned to form a first stack in a first area and a second stack in a second area. A second protective layer is formed on the sidewalls of the first and the second stacks. A blocking layer is formed in the first area and a first spacer formed on the sidewall of the second protective layers on the sidewall of the second stack in the second area. A semiconductor compound is formed in the substrate beside the first spacer. The blocking layer and the first spacer are removed. The hard mask layer in the first stack and the second stack is removed.

Method for fabricating semiconductor device and PMOS device fabricated by the method

A semiconductor process is provided. The prior steps include: a first gate including a first cap layer and a second gate including a second cap layer are formed on a substrate. A hard mask layer is formed to cover the first gate and the second gate. The material of the hard mask layer is different from the material of the first cap layer and the second cap layer. The hard mask layer is removed entirely after a lithography process and an etching process are performed. The following steps include: a material is formed to entirely cover the first gate and the second gate. The material, the first gate and the second gate are etched back to make the first gate and the second gate have the same level and expose layers in both of them.

Semiconductor process

Growing community of inventors

Kaohsiung, Taiwan

Shih-Hao Su