National Central University

Shih-Hao Chien

Jim-Wei Wu

Bo-Jun Chen

An apparatus and method for removing fixture effect are disclosed herein. The device processes the calibration scattering parameters of the 2×-Thru calibration fixture pair through a time domain algorithm. The algorithm consists of time domain gating and ringing data processing to obtain partial S-parameters corresponding to the fixtures on each side of the 2×-Thru calibration fixture pair. The resulting scattering parameters are then substituted into the Mason's gain formula together with other known calibrated scattering parameters to determine all scattering parameters corresponding to the fixture on each side. Finally, in the de-embedding method, the S-parameters of the overall structure and the S-parameters of the fixtures on each side are used to obtain the scattering parameters of the DUT, thereby removing the fixture effect caused by the test fixture pair.

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Taoyuan, Taiwan

Shih-Hao Chien