Jasco Corporation

Shigeyuki Kimura

Yoshihito Narita

Fuminori Sato

Tsutomu Inoue

Atsushi Yamada

Tohru Sakamaki

Norihito Hujiwara

A near field analysis apparatus comprising: an irradiation optical system comprising an irradiation-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating irradiation-side guide light onto an adjustment surface via the irradiation-side adjustable optical system; a light collecting optical system comprising a light-collection-side adjustable optical system for adjusting the position or angle of an optical axis thereof, and irradiating light-collection-side guide light onto the adjustment surface via the light-collection-side adjustable optical system; an irradiation-side adjustment device for adjusting the position or angle of the irradiation-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match; and a light-collection-side adjustment device for adjusting the position or angle of the light-collection-side adjustable optical system such that the spots of the guide light, which are observed at the adjustment surface, match.

Near field analysis apparatus having irradiation-side guide light and light-collection-side guide light

The near-field spectrometer comprises a Z-axis scanner for bringing a sample and the tip of a probe close to each other at a predetermined distance within a near-field region when obtaining near-field spectral information and separating them from each other at a predetermined distance outside a near-field region when obtaining back ground spectral information, and a data processor for obtaining the true near-field spectral information free from the background by subtracting the background spectral information from the near-field spectral information, characterized in that a background information collector, during the separation of the sample and the tip of the probe at a predetermined distance outside the near-field region, obtains the background spectral information for the corresponding portion to be measured.

Near-field spectrometer having background spectral information

A near-field microscope comprising: a probe for scattering a near-field light; light emitting device including a light source for emitting light to a sample or said probe; and light sampling device for sampling and detecting a light that includes information of the sample scattered by said probe, said microscope comprising: control device for spacing said sample or probe from a field of a near-field light generated by said light emission or disposing the sample or probe at a position that is shallow in a field of near-field light, thereby detecting a noise by said light sampling device; inserting said sample or probe deeply into a field of near-field light generated by said light emission, thereby detecting light intensity by said light sampling device; and computing device for computing a measurement result obtained by subtracting a noise from said light intensity.

Growing community of inventors

Hachioji, Japan

Shigeyuki Kimura