Matsushita Electric Industrial Co., Ltd.

Shigeru Watari

Joji Katsura

Yoshiyuki Takagi

A cell containing a test pad is defined as a standard cell, in the same fashion as a logic circuit, and is disposed and wired, together with logic circuit cells, in the internal circuit region excluding the input and output pad regions around the chip by a standard cell system. The cell containing the test pad possesses the pad region for feeding a reference potential in the cell, or the pad region capable of detecting a reference signal, or the layout pattern for expressing an arbitrary code for distinguishing the cell from other cells.

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Nara, Japan

Shigeru Watari