Adv Antest Corporation

Yokogawa Medical Systems, Limited

Hirakawa Hewtech Corporation

Shinko Electric Industries Co., Ltd.

Ge Medical Systems Global Technology Company, LLC

Tyco Electronics Japan G.k.

Yokogawa Hokushin Electric Corp.

Shigeru Matsumura

Hiroyuki Hama

Shigeru Murayama

Masanori Kaneko

Takashi Sekizuka

Yoshihiro Abe

Takaji Ishikawa

Kazutaka Osawa

Mitsuo Iwasaki

Yuichiro Izumi

Mitsutoshi Higashi

Hideaki Sakaguchi

Tadao Saito

Akinori Shiraishi

Ryo Takahashi

Hiroyuki Nagai

Toshikazu Suzuki

Keiki Yamaguchi

Fumio Kurotori

Shin Sakiyama

Haruo Kurochi

Eiichiro Takemasa

Hiroyuki Shiotsuka

Tetsuya Kuitani

Yukio Ishigaki

Noriaki Shimasaki

Noriyoshi Kozuka

Katsushi Sugai

Eiichi Sekine

Jiro Namikawa

Kohei Kato

Kazuyuki Tomarikawa

Shiro Mori

Hiroyuki Kimura

Tetsuo Yamaguchi

Koichi Shiroyama

Takao Ishido

Takaaki Kusama

Mitsuo Nanjyo

[Problems to be solved] To provide a test-use individual substrate capable of improving testing accuracy and connecting reliability. [Means for solving the Problems] A test-use individual substratewhich is used for testing a semiconductor wafer, comprises a main body portion, thin portionsextending from the main body portionand being relatively thinner than the main body portion, and bumpsprovided on the thin portions

Test-use individual substrate, probe, and semiconductor wafer testing apparatus

A fixing apparatus for fixing a probe card to a holder includes a screw fixed to the holder and binding the probe card onto the holder in a vertical direction, a first bearing member intervening between a head of the screw and the probe card and allowing expansion and contraction of the probe card with respect to the screw in a horizontal direction, and a second bearing member intervening between the probe card and the holder and allowing expansion and contraction of the probe card with respect to the holder in the horizontal direction.

Fixing apparatus for a probe card

A probe card is provided which includes: probe needles electrically contacting input/output terminals of an IC device formed on a semiconductor wafer W; a mount base on which the probe needles are mounted; a support column supporting the mount base, a circuit board having interconnect patterns electrically connected to the probe needles via bonding wires; and a base member and stiffener for reinforcing the probe card. The mount base and the circuit board are noncontact.

Connection board, probe card, and electronic device test apparatus comprising same

A connector assembly, for electrically connecting electrical cablesto a test head, comprises a plurality of types of cable side connectorsrespectively attached to one end of the electrical cable; and a intermediate connectorto which the plurality of types of cable side connectorsare connected in a detachable manner, and the intermediate connectorhaving a first engagement parthaving a shape with which all types of cable side connectorscan be engaged and an output terminalable to be engaged with a test head side connectorelectrically connected to a pin electronics board of the test head

Connector assembly, receptacle type connector, and interface apparatus

An interface apparatusmounted on a test headcomprises: an electrical cablehaving one end electrically connected to a socket board; a device side connectorattached to the other end of the electrical cable; and a intermediate connectorelectrically connecting a test head side connectorprovided on the test headand the device side connectorand the intermediate connectorhaving a connector bodyprovided at a bottommost part of the interface apparatus; an engagement holeprovided at the connector bodyand having the device side connectordetachably connected to it; and an output terminalprovided at the connector bodyand having the test head side connectordetachably connected to it.

Interface apparatus for electronic device test apparatus

A system for mating and demating a plurality of connectors mounted on a socket board with and from a plurality of corresponding connectors mounted on a motherboard includes: an adapter that is arranged above a surface opposite to the socket board surface on which the connectors are arranged and is movable in a direction in which the connectors are mated and demated; pressing means which contacts the surface of the socket board on which the semiconductor components are placed to press the socket board to the motherboard by lowering the adapter; and pulling means each of which engages with an engaging hole formed in the socket board and pulls the socket board in the direction in which the socket board is separated from the motherboard by lifting the adapter.

System for mating and demating multiple connectors mounted on board of semiconductor test apparatus

A contact terminal for measurement is provided, for transmitting a signal between a desired probe pin among a plurality of probe pins arranged in parallel at a predetermined distance in a predetermined direction on the surface of a probe substrate and an external measurement apparatus. The contact terminal for measurement includes: a signal terminal having an width smaller than the distance between the probe pins provided on both sides of one probe pin in the arrangement direction; two ground terminals to which a ground potential is applied, which are provided on both sides of the signal terminal in the arrangement direction and which have each width larger than that of the signal terminal in the arrangement direction; and a signal line electrically connecting the signal terminal to a signal input terminal of the external measurement apparatus.

Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus

A foam coaxial cable, including an inner conductor, a foam insulating layer formed on the outer periphery of the inner conductor, an outer conductor formed on the outer periphery of the foam insulating layer, and an outer cover formed on the outer periphery of the outer conductor. A skin layer having a generally complete round outline is formed on the outer periphery of the foam insulating layer.

Foam coaxial cable and method of manufacturing the same

A connector mounted on a board having a plurality of board signal lines for transmitting a signal and a board ground line grounded. Each of the plurality of board signal lines includes a plurality of signal terminals formed in correspondence to each of the signal lines. Each of the signal terminals comprises: a signal core line formed of conductor by extension in the shape of a line; a shield for core line formed of conductor insulated from the signal core line electrically so as to extend in an axis direction of the signal core line and enclose the signal core line; a signal electrode formed by extension from the signal core line for connecting the signal core line with the board signal line corresponding to the signal terminal; and a plurality of ground electrodes extended from the shield for core line and opposed to each other by intervention of the signal electrode for connecting the shield for core line with the board ground line respectively.

Connector

A probe card used for establishing electric contact with an electric part to inspect an electric characteristic thereof comprises a plurality of conductors, each transmitting a signal used for inspection, and a plurality of bumps, each formed on one of the plurality of conductors, which are used for establishing mechanical contact with the electric part. Each bump includes a lower portion fusedly arranged on the conductor and an upper portion taperedly formed in such a fashion that a cross section of the bump closer to a tip thereof is smaller.

Bump and method of forming bump

A connector including a plug and a socket and a driving section for fitting the plug and the socket by moving the driving section in a first direction substantially perpendicular to the fitting direction of the socket and the plug. The driving section has a first groove part provided in the first direction, and a second groove part provided substantially perpendicular to the first direction. The plug has a first protruding portion engaging with the first groove part, and the socket has a second protruding portion engaging with the first groove part. When the driving section moves in the first direction, the driving section depresses the second protruding portion in the fitting direction at the second groove part to move the socket in the fitting direction, thus fitting the plug in the socket.

Connector, electronic component fixing device, and tester

A foamed coaxial cable with high precision according to the present invention comprises: an internal conductor twisted with a plurality of electrically conductive wires; a foamed insulator with its low dielectric constant made of a porous tape body formed on the outer periphery of this internal conductor; an external conductor made of a number of electrically conductive thin wires braided on the outer periphery of this foamed insulator; and an outer sheath made of a resin having heat resistance formed on the outer periphery of this external insulator, wherein the precision of external diameter of the internal conductor is 4/1000 mm or less, the precision of external diameter size of the foamed insulator is &#xb1;0.02 mm, the insulator is formed in a completely circular shape, the precision of external diameter size of the external conductor is &#xb1;2%, the external conductor is formed in a completely circular shape, and the precision of characteristic impedance value between the internal conductor and the external conductor having the foamed insulator interposed therebetween is &#xb1;1 &#x3a9;.

High accuracy foamed coaxial cable and method for manufacturing the same

To detect a boundary line between different objects in contact which appear to be the same object as their structural consistencies are identical or substantially identical, there are provided a motion vector detecting unit which calculates motion vectors in plural parts from plural images obtained at different times, a boundary block extracting unit which extracts a boundary block from the difference of motion vectors, and a boundary line estimating unit which estimates a boundary line based on the extracted boundary block.

Boundary line detecting method and apparatus, image processing method and apparatus, non-boundary line detecting method and apparatus

Growing community of inventors

Tokyo, Japan

Shigeru Matsumura