Kabushiki Kaisha Toshiba

Tokyo Shibaura Denki Kabushiki Kaisha

Tokyo Shibaura Electric Co., Ltd.

Shigeru Matake

Yasuyuki Hotta

Toshiro Hiraoka

Yoshihiro Akasaka

Koji Asakawa

Katsuyuki Naito

Wu Mei

Yoshihiko Nakano

Taishi Fukazawa

Norihiro Yoshinaga

Masayuki Oba

Hideo Aoki

Satoshi Mikoshiba

Shuzi Hayase

Rumiko Hayase

Naoko Yamaguchi

Yoshiaki Kawamonzen

Yukihiro Mikogami

Misa Sawanobori

Naoko Kihara

Naohiko Oyasato

Kei Takano

Atsuo Imai

Yoshiaki Sugizaki

Akira Fujimoto

Chiaki Takubo

Hiroshi Endo

Hiroshi Inoue

Tsutomu Nakanishi

Atsuko Iida

Katsutoshi Komeya

Mitsuyoshi Endo

Masami Sugiuchi

Takashi Yoshida

Seizaburo Shimizu

Masataka Miyamura

Kou Yamada

According to an embodiment, a porous catalyst layer includes a metal portion including plural noble metal-including sheets stacked apart from each other, and a porous nanocarbon layer disposed between two adjacent noble metal-including sheets. The plural noble metal-including sheets in the metal portion have an integrated portion. The porous nanocarbon layer includes fibrous nanocarbon.

Porous catalyst layer, membrane electrode assembly, and electrochemical cell

Embodiments of the present disclosure aim to provide a catalyst layer ensuring a high cell voltage and having both excellent robustness and sufficient endurance, and also to provide a process for producing the layer, a membrane electrode assembly and an electrochemical cell. The catalyst layer comprises two or more noble metal-containing layers, and a porous ceramic layer placed between the noble metal-containing layers. Further, in the catalyst layer, voids exist between the porous ceramic layer and the noble metal-containing layers.

Catalyst layer, method for producing the same, membrane electrode assembly and electrochemical cell

An electrode of an embodiment includes a base material, and a catalyst layer provided on the base material and having a porous structure. When a sum of heights of all peaks belonging to Ir oxide is I0, the height of a peak of IrO(110) is I1, and the height of a peak of IrO(211) is I2, a ratio of (I1+I2)/I0, which is a ratio of spectra obtained by X-ray diffraction measurements using K&#x3b1; rays of Cu in the catalyst layer, is 50% or more and 100% or less in a range of a diffraction angle of 20 degrees or more and 70 degrees or less.

Electrode, membrane electrode assembly, electrochemical cell, and stack

According to one embodiment, the noble metal catalyst layer includes first noble metal layer and a second noble metal layer formed on the first noble metal layer. The first noble metal layer includes a first noble metal element and has a porosity of 65 to 95 vol. %, a volume of pores having a diameter of 5 to 80 nm accounts for 50% or more of a volume of total pores in the first noble metal layer. The second noble metal layer includes a second noble metal element, and has an average thickness of 3 to 20 nm and a porosity of 50 vol. % or less.

Noble metal catalyst layer, membrane electrode assembly, and method for producing noble metal catalyst layer

A carbon electrode of an embodiment includes: a graphene having a graphene skeleton, carbon atoms in the graphene skeleton being partially substituted by a nitrogen atom, wherein the graphene contains an oxygen atom, and the carbon electrode is doped with a cation.

Carbon electrode, carbon electrode production method, and photoelectric conversion device

An oxygen reduction catalyst of an embodiment includes: a stack of single-layer graphenes; and a phosphorus compound, wherein some of carbon atoms of the graphenes are replaced by nitrogen atoms, and the phosphorus compound has a peak of phosphorus 2orbital of 133.0 to 134.5 eV in X-ray photoelectron spectrum.

Oxygen reduction catalyst and electrochemical cell

A catalyst layer containing a catalyst material, the catalyst layer having a porosity of 20 to 90% by vol and satisfying a relation: R1&#x2267;R0&#xd7;1.2, wherein R1 is an alignment ratio of the catalyst layer; and R0 is an alignment ratio of the catalyst material in powder form having a random crystalline plane distribution, and each of the alignment ratios is calculated from a X-ray diffraction spectrum having a diffraction angle 2&#x3b8; range from 10 to 90 degree measured using Cu-K&#x3b1;-rays.

Catalyst layer, membrane electrode assembly, and electrochemical cell

According to one embodiment, a conductive material includes a carbon substance and a metallic substance mixed with and/or laminated to the carbon substance. The carbon substance has at least one dimension of 200 nm or less. The carbon substance includes a graphene selected from single-layered graphene and multi-layered graphene, a part of carbon atoms constituting the graphene is substituted with a nitrogen atom. The metallic substance includes at least one of a metallic particle and a metallic wire.

Conductive material

The present invention provides a highly efficient light-extraction layer and an organic electroluminescence element excellent in light-extraction efficiency. The light-extraction layer of the present invention comprises a reflecting layer and a three-dimensional diffraction layer formed thereon. The diffraction layer comprises fine particles having a variation coefficient of the particle diameter of 10% or less and of a matrix having a refractive index different from that of the fine particles. The particles have a volume fraction of 50% or more based on the volume of the diffraction layer. The particles are arranged to form first areas having short-distance periodicity, and the first areas are disposed and adjacent to each other in random directions to form second areas. The organic electroluminescence element of the present invention comprises the above light-extraction layer.

Light-extraction layer of light-emitting device and organic electroluminescence element employing the same

According to one aspect of the invention, a contact sheet for testing electronic parts, comprising an insulating porous layer; and a connection electrode which is disposed on the insulating porous layer and electrically connect the electrode or terminal of the electronic parts and the terminal of a test apparatus; wherein the connection electrode is embedded below at least one main surface of the insulating porous layer.

Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts

An electronic device connecting method according to a first aspect of the present invention includes: mounting an electronic device having at least one electrode portion on a sheet-like porous member having a hole therein so that the electrode portion is close to the porous member; selectively irradiating a predetermined region of the porous member, on which the electronic device is mounted, with energy lines to form a latent image in an irradiated or non-irradiated portion of the porous member, the predetermined region including a portion close to the electrode portion; after irradiating with the energy lines, filling a conductive material in a hole of the latent image of the porous member to form a conductive portion; and bonding and integrating the porous member, in which the conductive portion is formed, to and with the electronic device.

Method for connecting electronic device

Disclosed is a wiring member comprising a sheet-like porous substrate provided with a large number of open-cells which are three-dimensionally branched and opened to a first major surface as well as to a second major surface of the porous substrate, and a conductive portion formed on the first major surface of the porous substrate and formed at least partially an inter-penetrating structure together with the porous substrate at an interface of the porous substrate. The apertures of the open-cells on the first major surface have an average diameter and an average number of the apertures, at least one of which is smaller than that of the second major surface.

Wiring member and method of manufacturing the same

A semiconductor test unit comprises a test circuit for inputting/outputting a test signal to/from an examined electronic product, a test signal wiring electrically connected to the test circuit, a contact board electrically connected to an electrode of the examined electronic product and provided with an electrically conductive via to which the test signal is transmitted, a multilayer circuit board electrically connected to the conductive via and the test signal wiring, located under the bottom face of the contact board, and provided with at least one through-hole, and a vacuum attachment mechanism for attaching thereto and holding the examined electronic product, the contact board, and the multilayer circuit board by vacuum. The contact board is made of an insulative material, has top and bottom faces, and is provided with at least one through-hole.

Semiconductor test unit having low contact resistance with examined electronic products, semiconductor contact board, method for testing semiconductor device, semiconductor device, and method for manufacturing thereof

A mask used for exposing a porous substrate to form a first region and a second region, the first region being filled with a conductive material piercing through the entire thickness of the porous substrate to constitute an interfacial conductive portion, the second region being filled with a conductive material not piercing the entire thickness of the porous substrate to constitute a non-interfacial conductive portion. The mask includes a first light-transmitting region for exposing the first region, and a second light-transmitting region for exposing the second region, said second light-transmitting region including an aggregation of fine patterns of which an average aperture ratio is not more than 50% of an average aperture ratio of the first light-transmitting region and a size of said fine patterns of the second light-transmitting region being in the range of 0.1 &#x3bc;m to 10 &#x3bc;m.

Mask used for exposing a porous substrate

Disclosed is a method of manufacturing a composite member having a conductive pattern, comprising (1) forming on a surface of an insulating body a photosensitive layer containing both a photosensitive compound forming an ion-exchange group upon irradiation with an energy beam and a crosslinkable compound having a crosslinkable group, (2) forming a pattern of ion-exchange groups by selectively exposing the photosensitive layer to an energy beam so as to form an ion-exchange group in the exposed portion, (3) crosslinking the crosslinkable compound contained in at least the exposed portion of the photosensitive layer, (4) allowing metal ions, or a metal colloid to be adsorbed on the pattern of ion-exchange groups formed by the selectively exposing, and (5) forming a composite member having conductive pattern by depositing a conductive material on the pattern of ion-exchange groups having the metal ions, or the metal colloid adsorbed thereon using an electroless plating.

Growing community of inventors

Yokohama, Japan

Shigeru Matake