Hitachi, Ltd.

Tokyo Gas Company Limited

The Tokyo Electric Power Company, Incorporated

Chubu Electric Power Company, Inc.

The Chugoku Electric Power Co., Inc.

Shigeru Izumi

Hiroshi Kitaguchi

Katsutoshi Satoh

Atsushi Yamagoshi

Hiroshi Kamimura

Kouji Kuwabara

Tarou Takagi

Noriyuki Sadaoka

Shouhei Numata

Hiroshi Miyai

Katsutoshi Sato

Satoshi Suzuki

Yasuko Aoki

Yukiya Hattori

Shoji Kamata

Tetsuya Matsui

Makoto Senoh

Akihisa Kaihara

Yoshihiro Michiguchi

Masahiro Kondo

Kenji Miyata

Makoto Kikuchi

Setsuo Arita

Fuminobu Takahashi

Hideo Yusa

Atsushi Takagi

Katsuaki Kikuchi

Osami Matsushita

Mitsuo Suzuki

Tatsuo Hayashi

Susumu Hioki

Haruo Fujimori

Atomi Noguchi

Seishi Watahiki

Kenji Yokose

Taiko Ajiro

Fumio Murata

Satoru Kawasaki

Chikara Sato

Shinji Sonoda

Izumi Kobayashi

Motohiro Satoh

Koji Tsumaki

Shinji Mitani

Kimio Yamada

Yukito Koiwa

Yuuji Hashimoto

Shinji Naitoh

Fumiyasu Ookido

Shunsuke Utena

An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.

X-ray sensor signal processor and X-ray computed tomography system using the same

To provide a radioactive gas measurement apparatus that is simply constructed and can efficiently measure Xe-133 in a radioactive gas on-line under the condition that the radioactive gas is mixed with interference N-13, an apparatus is provided for measuring a radiation emitted from Xe-133, including an anticoincidence counter circuitthat conducts counting if it receives an output of a main detectorwhen it does not receive outputs of scintillation detectorsand, and a gate circuit, a plate-shaped semiconductor detector is used as the main detector, and a material not emitting a characteristic X ray in the range from 70 to 90 keV is used for a shielding structure. In particular, the thickness of the semiconductor detectoris set to fall within a range from 2 mm to 7 mm, thereby improving the analysis precision.

Radioactive gas measurement apparatus and failed fuel detection system

An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.

An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor, and an integration circuit for integrating the output signal of the X-ray sensor from which the DC component is removed by the filter.

An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray sensor and a circuit for obtaining a difference between a voltage corresponding to a current including a dark current generated in the X-ray sensor by incidence of the X-ray and a voltage corresponding to the dark current.

An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray semiconductor sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray semiconductor sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of the output signal of the X-ray semiconductor sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit includes a filter for removing a DC component from the output signal of the X-ray semiconductor sensor, and an integration circuit for integrating an output signal of the X-ray semiconductor sensor from which the DC component is removed by the filter.

An X-ray sensor signal processor including capacitorsfor removing DC components (dark currents) from output signals of semiconductor sensorstodetecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifiera resistorand a capacitor) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitorsBy this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.

X-ray sensor signal processor and x-ray computed tomography system using the same

An X-ray sensor signal processor including capacitors for removing DC components (dark currents) from output signals of semiconductor sensors to detecting pulse-like X-rays passed through an object, and integrators (each of which is constituted by a combination of an operational amplifier a resistor and a capacitor ) for integrating the output signals of the X-ray sensors after removal of the DC components by the capacitors By this, a value proportional to the average number of photons in X-rays can be obtained even in the case where a small number of incident photons are given, and an X-ray CT system using the X-ray sensor signal processor.

A non-destructive inspection apparatus has a radiation source, a radiation detector, a radiation source diver, a detector driver, a drive controller, a delay circuit, a radiation signal processing circuit, a memory, a computer, a display device, and an input device. The radiation detector consists of one-dimensional or two-dimensional array of detectors having a long collimator whose pores are in parallel with the radiation angle of the radiation emitted in an angular pattern from the radiation source, whereby a transmission image of a large size structure can be obtained at high speed and with a high resolution. Furthermore, the detect position in an inspection object can be specified by analyzing a plurality of specified transmission images using the inspection apparatus.

Non-destructive inspection apparatus and inspection system using it

An X ray CT system wherein radiation is irradiated on an object to be inspected during rotation of the object to obtain image data, in which case a rotary center of the object is set at a plurality of different positions in an angle of an angular pitch angle of radiation detectors for each turn, and a tomographic image is reconstructed from data on the X-ray passed through the objected obtained by rotating the object by a polurality of turns.

Computerized tomography system

An imaging method of an X-ray computerized tomography (X-ray CT) comprising the steps of reconstructing a partial region including a region of interest from penetrating data of an object, extracting only shape information from the reconstructed image, setting a threshold function determined by resolution to the reconstructed image information which is equivalent to linear absorption coefficient distribution (density), extracting the reconstructed image information by making the information into bi-values or tri-values based on the threshold function or by differentiating the information, and extracting and imaging only a portion where the linear absorption coefficient distribution (density) changes stepwise.

Imaging method of X-ray computerized tomography and apparatus for X-ray

The invention provides a high sensitivity semiconductor radiation detection apparatus having pn junctions formed in opposite surfaces of at least one semiconductor wafer. A common electrode for the pn junctions is formed in the substrate region of the semiconductor wafers, and a variable reverse bias voltage is supplied to an electrode formed in contact with at least one of the pn junctions, to vary the thickness of the depletion region generated at said pn junction, and hence the sensitivity of said junction to incident radiation of varying energy levels. By adjusting the relative thickness of the respective depletion regions, different types of radiation may be distinguished.

Semiconductor radiation detection apparatus for discriminating radiation

Neutron individual dose meter, neutron dose rate meter, neutron detector

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Tokyo, Japan

Shigeru Izumi