Kabushiki Kaisha Shinkawa

Shigeru Hayata

Ryuichi Kyomasu

Satoshi Enokido

Toshiaki Sasano

Shigeru Fuke

Masaki Yokohama

An imaging device and method of a bonding apparatus in which the imaging device includes: a high-magnification optical system having first and second high-magnification optical paths that extend to multiple imaging planes through a high-magnification lens and have different optical path lengths from the high-magnification lens to the respective imaging planes correspondingly to multiple subject imaging ranges which are at different distances from the high-magnification lens; and a low-magnification optical system having a low-magnification optical path that extends to an imaging plane through a low-magnification lens and having a field of view wider than those of the high-magnification optical paths. The imaging elements on the respective imaging planes in the high-magnification optical system are adapted to image semiconductor chips, while the imaging element on the imaging plane in the low-magnification optical system is adapted to image a lead frame.

Imaging device and method for a bonding apparatus

A bonding method and apparatus that uses a position detection camera which takes images of a workpiece and a light path conversion device which directs the image of an area near the lower end of a capillary to the position detection camera. The image acquired by the position detection camera is processed, and an execution is made so as, for instance, to measure the diameter of a ball formed on a wire extending from the lower end of the capillary, to measure the tail length extending from the lower end of the capillary, to measure the ball position from the undersurface of the capillary, to observe the bending of the tail of the wire, to inspect the external appearance of the capillary, and to measure the amplitude of vibration of the capillary when an ultrasonic vibration is applied to the capillary.

Wire bonding method and apparatus

In measuring the position of a bonding tool accurately in offset correction in a bonding apparatus, the tool is moved to approach a reference member, the tool is illuminated with a reference pattern by a laser diode, and the deviation between the reference member and tool in one horizontal direction is measured based upon the image of the reference pattern projected on the tool. A position detection camera images the tool in another horizontal direction, thus measuring the deviation of the tool and reference member. The position detection camera is moved to approach the reference member, and the deviation between the position detection camera and the reference member is measured by the position detection camera. The accurate offset amounts between the position detection camera and the tool are determined based upon these measured values and amounts of movement of the position detection camera and the tool.

Bonding apparatus

Offset measurement method, tool position detection method and bonding apparatus

A bonding apparatus that includes a bonding tool through which a wire passes and which performs bonding on a workpiece, a position detection camera which takes images of the workpiece, a reference member which is disposed in a specified position, and an optical assembly which conducts the image of the tool and reference member to the position detection camera. A lens used in the position detection camera and a lens installed in the optical assembly are arranged so that such lenses construct an afocal optical system.

A wire bonding apparatus including a bonding tool that performs bonding on a bonding part, a position detection camera which has a lens barrel and images the bonding part, a light source which emits illuminating light downward through the lens barrel, and a light path conversion device that directs an image of an area near the lower end of the tool to the position detection camera. The light path conversion device includes a wavelength-selective filter that is provided so as to be within a light path of the image of the area near the lower end of the tool. The wavelength-selective filter allows illuminating light of the light path conversion device to pass therethrough but prevents the illuminating light from the lens barrel side from passing therethrough.

Wire bonding apparatus

Wire bonding method and apparatus in which axial center of a bonding tool is brought to a reference member, and light-emitting diodes are sequentially lit so that images of the reference member and bonding tool in the X and Y directions are acquired by an offset correction camera. In this way, the amount of deviation between the bonding tool and the reference member is measured. Then, a position detection camera is caused to approach the reference member, and the amount of deviation between the optical axis of the position detection camera and the reference member is measured by the position detection camera. The accurate offset amount are determined on the basis of these measured values and the amounts of movement.

Bonding apparatus and bonding method

A wire bonding apparatus and method in which an axial center of a bonding tool is moved to the vicinity of a near reference member, laser diodes are sequentially lit, images of the reference member and bonding tool in the horizontal directions are acquired by a position detection camera, and amounts of deviation between the tool and the reference member are measured. Then, the position detection camera is caused to approach the reference member, and amounts of deviation between the optical axis of the position detection camera and the reference member are measured by the position detection camera. The accurate offset amounts are determined from the measured values and amounts of movement. Image light of the tool and reference member is conducted to the position detection camera by prisms and half-mirror, without a camera for detecting the amount of deviation between the tool and reference member.

A bonding apparatus with an optical detecting device that detects any positional discrepancy between first and second parts which are to be bonded together, the optical detecting device including an optical probe that comprises: first and second image acquisition prisms which respectively reflect, in different directions, first and second images of the first and second parts respectively; a first optical system introduction prism (or mirrors) which causes the first image of the first part that passes through the first image acquisition prism to be reflected an even number of times and then sends this first image to a first image pick-up device through a first focusing device; and a second optical system introduction prism which causes the second image of the second part that passes through the second image acquisition prism to be reflected an odd number of times and then sends this second image to a second image pick-up device through a second focusing device.

In a flip-chip bonding apparatus, a die inverting device is installed on an optical recognition device so that a vacuum suction chucking nozzle that is provided on the die inverting device can rotate in the direction of a pick-up position and in the direction of a die transfer position in an outside area of an open window of the optical recognition device, so that the bonding apparatus can be compact and has an improved precision of recognition of the amount of positional deviation of the die.

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Tachikawa, Japan

Shigeru Hayata