Fujitsu Semiconductor Limited

Fujitsu Corporation

Shigeru Goto

Kazuhiro Tashiro

Eiji Takada

Kouji Uesaka

Yuji Maruyama

Kazuhiko Shimabayashi

Takayuki Nakashiro

Susumu Koshinuma

Yuichi Watanabe

Yuushin Kimura

Yasuhiko Tandou

Kiyotaka Shinada

Masayoshi Shirakawa

A signal processing section included in a semiconductor testing circuit supplies a test signal inputted from a tester via a signal line to a plurality of DUTs and generates a test result by synthesizing response signals transmitted from the plurality of DUTs on the basis of the test signal. A test result output section included in the semiconductor testing circuit makes a voltage level of the test result differ from a voltage level of the test signal inputted and outputs the test result to the tester via the signal line.

Semiconductor testing circuit, semiconductor testing jig, semiconductor testing apparatus, and semiconductor testing method

A testing device of a semiconductor device includes a first board having a plurality of openings; a frame body provided in the openings, the frame body having a frame in which a plurality of probe needles is provided; and a plurality of second boards provided perpendicular to the first board in the periphery of the openings, the second boards being connected to the first board; wherein the probe needles pierce the frame so as to be connected to the second boards from the periphery of the frame body via the openings.

Testing device for testing a semiconductor device

Growing community of inventors

Yokohama, Japan

Shigeru Goto