Kabushiki Kaisha Toshiba

Fuji Photo Film Company, Limited

Sumitomo Metal Industries, Inc.

The University of Tokyo

Other

Matsushita Electric Industrial Co., Ltd.

Ricoh Elemex Corporation

Kochi Prefectural Public University Corporation

Toyota Jidosha Kabushiki Kaisha

Fuji Jukogyo Kabushiki Kaisha

Disco Corporation

Kabushiki Kaisha Toyota Chuo Kenkyusho

Toshiba Lighting & Technology Corporation

Suncom Co., Ltd.

Shigeru Ando

Takashi Ishigami

Noriaki Yagi

Mituo Kawai

Takashi Yamanobe

Toshihiro Maki

Michio Satou

Minoru Obata

Muneo Harada

Yasuhiro Kaneko

Toshiyuki Matsumoto

Daisuke Mitsuhashi

Takaya Miyano

Toru Kurihara

Kenji Tanaka

Toshiki Kindo

Takashi Yoshida

Hidemi Sasaki

Masaaki Tamatani

Hitoshi Suzuki

Hirofumi Funabashi

Keiichi Shimaoka

Kazuaki Nakagawa

Hideo Fukamachi

Naoki Ikeuchi

Mineki Soga

Akira Taya

Shinji Kamimaru

Kenji Terashima

Yoichi Kato

Nobutaka Ono

Yoji Yuge

Masaki Sohma

Hidenori Ito

Tomoyuki Nishiyama

Yasuichi Mitsushima

Toshihiro Wakita

Nishiyama Tomoyuki

Michihiro Kobayakawa

Kenji Nagao

Toshiaki Nakagawa

Takahiko Oasa

Michihiko Yoshimura

Shoichi Fukui

An image processing device includes a storage unit, an initial setting unit configured to store a position of an optical axis neighborhood point in a first image obtained by the imaging unit in the storage unit as an initial position of a specific point in the first image in association with image features of a surrounding area of the optical axis neighborhood point, a search unit configured to search for a corresponding point of the specific point in a second image obtained by the imaging unit based on the image features of the surrounding area of the specific point stored in the storage unit, and an output unit configured to output a position of the corresponding point in the second image as a position of the reference point in the second image.

Image processing device

An inspection system of an embodiment includes: a planar illumination unit that temporally and spatially varies intensities of light in a periodic manner; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.

Inspection system and inspection method

An inspection system of an embodiment includes: a planar illumination unit that temporally varies an intensity of light in a periodic manner by spatially moving a stripe pattern of the intensity of light; a time-correlation image generator that generates a time-correlation image with a time-correlation camera or an image capturing system that performs an operation equivalent to that of the time-correlation camera; and a calculation processor that calculates a characteristic from the time-correlation image, the characteristic corresponding to a distribution of normal vectors to an inspection target surface and serving to detect an abnormality based on at least either a difference from a surrounding area or a difference from a reference surface.

A frame fixing jig for mounting on a chuck table has a chuck portion for holding a workpiece in an annular frame, and a body portion for supporting the chuck portion. A frame support member (FSM) supports the annular frame, and a ring presses the frame against the FSM. The FSM has a through hole. The ring has an annular base portion and an engaging portion. The engaging portion can be inserted through the through hole, thereby engaging the FSM. The engaging portion includes a rotating shaft extending through the annular base portion, a knob fixed to the upper end of the shaft, and a plate fixed to the lower end. The surface around the lower end of the through hole or the upper surface of the plate is formed with an inclined surface for lowering the rotating shaft by rotating the plate inserted through the through hole.

Frame fixing jig

A microphone that identifies the direction along which acoustic waves propagate with one diaphragm, and has superior durability is provided. The microphone includes a circular diaphragm supported at a center portion thereof. When the diaphragm receives acoustic waves, each position around the center thereof will vibrate with a phase depending upon the direction of the acoustic waves. First electrodes are arranged on one surface of the diaphragm and second electrodes are arranged facing corresponding first electrodes to form a first capacitor. Third electrodes are arranged on the other surface of the diaphragm and fourth electrodes are arranged facing corresponding third electrodes to form a second capacitor. A controller applies a voltage to the second capacitors so that the capacitance of the first capacitors will be constant and identifies the direction along which the acoustic waves propagate based on the difference in the voltages applied to each of the second capacitors.

Microphone and a method of manufacturing a microphone

A head of a spliced film is transported to downstream side along a path by feed roller pairs, nip roller pairs and transport roller pairs; while the head of the spliced film is detected by a sensor located before a transport merging portion, the nip roller pairs are stop to rotate; a joint of the spliced film is detected based on a signal from a splice sensor; the spliced film is cut by a film cutter at the joint; and the head photographic film is separated from the spliced film and images are read.

Image reading apparatus

To achieve for a photographic film conveying device that no external force causing conveying speed to vary is applied to a photographic film during image reading, after a preceding photographic film is discharged from a reading conveying path, the time until a subsequent photographic film is conveyed to the reading conveying path is not long, or even if a photographic film set in a film supplying section is elongate, image reading of photographic films by an image reading section can be carried out efficiently, there is provided a photographic film conveying device comprising a section setting a discharge conveying section in a withdrawn state or a conveying state, a section controlling conveying of preceding and subsequent photographic films, or a section switching a conveying path of a photographic film.

Photographic film conveying device

A vibration wave detector having a first diaphragm for receiving vibration waves, such as sound waves and so on, to be propagated in a medium, a resonant unit having a plurality of cantilever resonators each having such a length as to resonate at an individual predetermined frequency, a retaining rod for retaining the resonant unit, a second diaphragm positioned on the opposite side of the first diaphragm with respect to the retaining rod, and a vibration intensity detector for detecting the vibration intensity, for each predetermined frequency, of each of the resonators, by the vibration waves received by the first diaphragm and propagated to the resonant unit through the retaining rod.

Vibration wave detector

A vibration wave detector, having a receiver for receiving vibration waves such as sound waves and so on to be propagated in a medium, a resonant unit having a plurality of cantilever resonators each having such a length as to resonate at an individual predetermined frequency, a retaining rod for retaining the resonant unit, a vibration intensity detector for detecting the vibration intensity, for each predetermined frequency, of each of the resonators, by the vibration waves received by the receiver and propagated to the resonant unit by way of the retaining rod.

Vibration wave detecting method and vibration wave detector

A vibration wave detector in which: a plurality of resonator beams, each having a different length and being allowed to resonate at a specific frequency, are provided; a piezoresistor is installed in each resonator beam; and the piezoresistors are parallel-connected so that vibration is converted to an electric signal by the piezoresistors so as to output the sum of vibration waveforms at the respective resonator beams. It is possible to control a gain of a specific frequency band by changing a voltage to be applied to the parallel circuit or changing the resistance value of each piezoresistor.

This is a highly purified metal comprising one metal selected from the group consisted of titanium, zirconium and hafnium. The highly purified metal has an Al content of not more than 10 ppm. It also has an oxygen content of more than 250 ppm, each of Fe, Ni and Cr contents not more than 10 ppm and each of Na and K contents not more than 0.1 ppm. The highly purified metal is obtained by either purifying crude metal by the iodide process or surface treating crude metal to remove a contaminated layer existing on the surface thereof and then melting The surface treated material with electron bean in a high vacuum.

Highly purified metal material and sputtering target using the same

A detecting apparatus consists of a covariance calculating section for calculating covariances Sij=.intg..intg..intg.(fi*fj)dxdydt (i,j.epsilon.{x,y,t}) with gradients fx, fy and ft of variable densities of pixels, a characteristic value calculating section for calculating characteristic values by utilizing the covariances to express characteristic changes in the variable densities of the pixels, a first-stage pixel classifying section for classifying the pixels into a FIX type denoting that an observed pixel is positioned in a static region of the dynamic image, a MOT type denoting that the observed pixel is positioned inside the moving region and an ACR type denoting that the observed pixel is positioned in a boundary region between the moving and the static regions, a second-stage pixel classifying section for re-classifying the pixels to match a classification type of the observed pixel with those of pixels surrounding the observed pixel, a contour candidate limiting section for limiting a region occupied by pixels re-classified into the ACR type as a candidate region, and a contour drawing section for drawing a contour of the moving section passing through a middle portion of the candidate region.

Detecting apparatus for detecting a contour of a moving region in a

A sputtering target that consists essentially of a continuous matrix of Ti-W phase, Ti phase having a particle diameter of 50 .mu.m or less distributed in the matrix, and a W phase having a particle diameter of 20 .mu.m or less also distributed in the matrix. Preferably the target contains aluminum in the range of 1 ppm or less. The target has high density and a low impurity content, which reduces the generation of particles from the target when it is used for sputtering. A method of manufacturing the sputtering target is also disclosed.

Ti-W sputtering target and method for manufacturing same

Growing community of inventors

Chiba, Japan

Shigeru Ando