Hitachi, Ltd.

Hitachi Instrument Engineering Co., Ltd.

Shigeo Mutoh

Isao Shindo

Kasumi Yoshida

Susumu Kai

A test strip automatic supply device has: a cylindrical container 11 provided with a slit 15 which is formed in a side wall thereof so as to contain an elongate test strip; a container-supporting table having, in an upper portion thereof, a semi-cylindrical concave surface provided with an opening 20 which is formed in a middle portion of the concave surface so as to allow a test strip fitted in the slit of the container 11 to fall through and be taken out; and a carrying stage 31 which receives and transports a test strip falling from the slit 15. While the transporting stage 31 is transporting a test strip, an optical detector finds whether the test strip is faced up or down. The device has such a function that a side-reversing mechanism flips it over during transportation if it is face down. An operator only has to put test strips in the container. The tests strips are automatically let out of the container one at a time.

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Hitachiota, Japan

Shigeo Mutoh