Ushio Denki Kabushiki Kaisha

Rohm Co., Ltd.

Shigenori Nozawa

Shigeki Matsumoto

Yukihiro Morimoto

Masashi Okamoto

Yoshimasa Ogawa

Yukiharu Tagawa

Toyohiko Kumada

Hiroshi Sugahara

Kenzo Kai

Tetuya Torikai

An absorption spectrometric analysis microchip with a chamber for holding a sample, a chamber for holding a reagent which reacts with this sample, a mixing chamber for mixing the reagent with the sample with the formation of a mixture and a sensing part with a sensing chamber for holding the mixture with a light incidence surface for the entry of light into the sensing chamber and a light exit surface for emergence of light from the sensing chamber. At least one of the light incidence surface and light exit surface is located in a recess area of the sensing part.

Absorption spectrometric analysis microchip and method

A unit for measurement of absorbance using a microchip has a microchip with a continuous cavity, a sample chamber, a reagent chamber, a reagent mixing chamber and a chamber for measuring absorbance, which is arranged in a straight line in the area of the continuous cavity. The microchip is located in a chip holder which has a capillary part which is arranged such that the light used to measure absorbance is delivered through the capillary part to the chamber for measuring absorbance, the capillary part having a smaller opening diameter than the diameter of the cross section which is perpendicular to the optical axis of the chamber for measuring absorbance.

Unit for measuring absorbance

A microchip testing device with a microchip having an absorbance measuring chamber for measuring absorbance, a transmitted light receiving unit for receiving light which has been emitted from a light source and has been transmitted through the absorbance measuring chamber, an aperture which extends in a straight line in the direction of the optical axis of the absorbance measuring chamber, with an entry opening for the light emitted by the light source on one end and a light exit opening on an opposite end from which the light enters the absorbance measuring chamber, an incident light beam splitter which is located in the optical path between the light exit opening of the aperture and the absorbance measuring chamber and which transmits part of the incident light and reflects another part of it, and a reflected light receiving part for receiving the light which has been reflected by the beam splitter.

Absorption spectrum photometry microchip testing device and components thereof

A device for measuring the reflection factor by irradiating a measurement area of a microchip with light, and in which a light receiving part is made to receive light reflected from the measurement area for determination of the reflection factor of the measurement area. The light receiving part is located in an angular region &#x3b8;, satisfying the relationship (&#xbd;)&#x3b1;&#x2266;&#x3b8;&#x2266;sin(1/n) and being located between angles &#x3b8;and &#x3b8;, &#x3b8;and &#x3b8;(in&#xb0;) being angles which the reflection light forms with respect to a normal on the edge of the irradiated surface of the area to be measured in a virtual plane which contains the emission center of the light emitting part and which is perpendicular to the microchip, wherein &#x3b8;is &#xbd; &#x3b1; and &#x3b8;corresponds to sin(1/n), where &#x3b1; (&#xb0;) is the scattering angle of the light radiated by the light emitting part which is located directly above the area to be measured, and wherein n is the index of refraction of the transparent component.

Device for measuring the reflection factor

The object of the invention to devise an electrical insertion body for a tube lamp in which sealing bodies of an electrically conductive inorganic material component and a dielectric inorganic material component and upholding parts of the electrodes are attached securely to one another by sintering, and in which neither leaks nor falling out of the upholding parts of the electrodes occur. The object is achieved as claimed in the invention, in an electrical insertion body for a tube lamp in which an upholding part of the electrode is inserted into the center opening of a respective sealing body of a functional gradient material for a tube lamp, in that in the boundary areas between the sealing bodies and the upholding parts of the electrodes one diffusion area at a time is formed, in which the electrically conductive inorganic material component of the sealing body, the metallic component of the upholding part of the electrode and a diffusion accelerator are present diffused into one another, which at the sintering temperature accelerates diffusion of the electrically conductive inorganic material component of the sealing body and of the metallic component of the upholding part of the electrode and that in this way the upholding part of the electrode and the electrically conductive inorganic material component of the sealing body are joined to one another.

Electricity lead-in body for bulb and method for manufacturing the same

A dielectric barrier discharge lamp with a translucent part made of silica glass which contains OH radicals and in which damage of the silica glass by UV radiation can be suppressed and a sufficient amount of UV radiation can be obtained in a dielectric barrier discharge lamp, in which a silica glass discharge vessel is filled with a discharge gas which forms excimer molecules by a dielectric barrier discharge and which is at least partially provided with a translucent part, by the translucent part having a ratio of non-hydrogen bonding OH radicals to the total number of OH radicals which is less than or equal to 0.36.

Growing community of inventors

Himeji, Japan

Shigenori Nozawa