Kabushiki Kaisha Topcon

Riken Corporation

Topcon Corporation

Shigenori Nagano

Yoshie Otake

Nobuo Hori

Yuichi Yoshimura

Hideyuki Sunaga

Akira Takada

Makoto Fujino

Hanako Aikoh

Koji Ikado

Hisashi Tsukada

Akira Yajima

Satoshi Yanobe

Yasuo Wakabayashi

Satoru Ishiguro

Shinya Ikoma

Masato Takamura

Takashi Takahashi

Yasushi Tanaka

Masayuki Momiuchi

Ken-ichiro Yoshino

Taizo Eno

Kenichiro Yoshino

Nicolas Gisin

Patrick Stamp

Rogerio Passy

Reiji Hashimoto

A non-destructive inspection system includes a non-destructive inspection apparatus and a management apparatus. The non-destructive inspection apparatus includes: a neutron emission unit capable of emitting a neutron beam; a gamma-ray detector capable of detecting a gamma ray; an apparatus case covering the neutron emission unit and the gamma-ray detector and including an opening; an outer shutter configured to open and close the opening; dose monitors each provided on the apparatus case and configured to detect a radioactive dose; an apparatus communication unit capable of transmitting apparatus information including the detected radioactive dose to the management apparatus and capable of receiving inspection permission information from the management apparatus; and an apparatus control unit configured to open the outer shutter and allows emission of the neutron beam from the neutron emission unit upon acquisition of the inspection permission information.

Non-destructive inspection device and non- destructive inspection system

A non-destructive inspection system includes: a neutron emission unit capable of emitting neutrons having a first neutron dose; a neutron detection unit capable of detecting a second neutron dose of neutrons scattered inside an inspection object A by the emission of the neutrons from the neutron emission unit; a gamma-ray detection unit capable of detecting a gamma dose of gamma rays released from the inspection object A by the emission of the neutrons from the neutron emission unit; and an analysis unit configured to calculate a content of a predetermined substance based on the gamma dose and correct the content of the predetermined substance based on the first neutron dose and the second neutron dose.

Nondestructive inspection system

A neutron emission unit is configured to emit neutrons such that a center axis (Nh) of a neutron emission intersects a center axis direction of collimators (a toe). A calculation unit is capable of generating information about an inspection object in the center axis direction of the collimators, based on position information of a neutron detector and/or position information of the neutron emission unit, information about an angle (&#x3b8;) at which the center axis of the neutron emission intersects the center axis direction of the collimators, and a neutron amount detected by the neutron detector.

Nondestructive test system comprising a neutron emission unit for emitting fast neutrons and a neutron detection unit for detecting thermal neutrons, and nondestructive test method

A non-destructive inspection systemincludes a neutron radiation sourcecapable of emitting neutrons N, and a neutron detectorcapable of detecting neutrons Nb produced via an inspection objectamong neutrons N emitted from the neutron radiation source. The neutron radiation sourceincludes a linear acceleratorcapable of emitting charged particles P accelerated; a first magnet sectionincluding magnetsandfacing each other, the magnetsandbeing capable of deflecting the charged particles P in a direction substantially perpendicular to a direction of emission of the charged particles P from the linear accelerator; and a target sectioncapable of producing neutrons N by being irradiated with the charged particles P that have passed through the first magnet section

Non-destructive inspection system comprising neutron radiation source and neutron radiation method

A non-destructive inspection system includes: a neutron emission unitcapable of emitting neutrons pulsed; a neutron detector capable of detecting the neutrons emitted from the neutron emission unit and penetrating through an inspection object; a storage unit storing attenuation information indicating a relationship between a material of the inspection object and attenuation of the neutrons; and a calculation unit capable of calculating distance information indicating a position of a specific portion in the inspection object in accordance with time change information which is information on a change over time in an amount of the neutrons detected by the neutron detector. The calculation unit is capable of generating information related to an amount of the specific portion from information based on the amount of the neutrons according to the time change information, using the distance information and the attenuation information.

Nondestructive testing system and nondestructive testing method

A non-destructive inspection systemincludes a neutron detecting unitand an arithmetic unit. The neutron detecting unitincludes a collimatorand a neutron detectorintegrated together. The collimatorhas a wall defining a through passage P. The wall is made from a material that absorbs neutrons produced via an inspection object. The neutron detectoris capable of detecting neutrons that have passed through the collimator. The arithmetic unitgenerates information on a position and composition of the inspection object, based on information on the neutrons detected by the neutron detector, positional information indicating the position of the neutron detecting unit, and posture information indicating the posture of the neutron detecting unit. The positional information and the posture information are detected by a position and posture detecting unit

Nondestructive inspecting system, and nondestructive inspecting method

An electronic distance meter includes an optical unit which emits light to a target object and receives the light reflected by the target object with a light receiving element, a measuring unit which calculates a length of round-trip time taken for the light to make a round trip to the target object and measures a distance to the target object according to the round-trip time of the received light, a light receiving system which receives and condenses the light reflected by the target object, and an optical guide which guides the light condensed by the light receiving element to the light receiving system, including a multi-mode graded index fiber and a multi-mode step index fiber coupled with each other.

Electronic distance meter

The invention provides a laser light emitting device, which comprises a laser light emitter for emitting a pump light, a resonator for emitting a laser beam by oscillating and amplifying the pump light and a multi-mode fiber for guiding the pump light emitted from the laser light emitter to the resonator, wherein a mode scrambler is provided on the multi-mode fiber, the pump light propagating the multi-mode fiber is stirred and a light intensity distribution is unified by the mode scrambler, and the pump light is entered to the resonator.

Laser light emitting device having a mode scrambler for unifying light intensity distribution

An optical branching device comprises a first lens member comprising a transmitting plane surface, a transmitting convex surface having an approximate center of curvature in the transmitting plane surface, and a first optical fiber and a second optical fiber firmly affixed on the transmitting plane surface of the first lens member. The transmitting convex surface has a wavelength-selective mirror surface that transmits light of a first wavelength and reflects light of a second wavelength. The light of the second wavelength, which is one of the wavelengths of light emitted from the first optical fiber and is reflected and converged by the wavelength-selective mirror surface, enters into the second optical fiber.

Optical branching device

An optical fiber cable, comprising a cable main unit with an optical fiber covered by a sheath and terminal units mounted on end portions of the cable main unit, wherein each of the terminal units has a transparent cover member with a refractive index approximately equal to the optical fiber, the cover member of at least one of the terminal units and the optical fiber are welded under such condition that the cover member is brought closer to or into contact with the optical fiber, and the cover member and the optical fiber are integrated with each other.

Optical fiber cable

An simlified optical configuration is acheved and, a direction discrimination function and a high resolving detection function are performed by one light receiving section. A TE mode emitted from an optical waveguide section,transmits through a beam splitter,and is guided to a measurement optical path. A TM mode emitted from the optical waveguide is reflected by the beam splitter,and is guided to a reference optical path. First and second &frac14; wave plates,and,are inserted in the respective optical paths, and the TE and TM modes are acted by a &frac12; wave plate while travelling forward and backward on the reference and measurement optical paths. A reference light (TM mode) is reflected by a reference reflection section,and transmits through the beam splitter section,A measurement light (TE mode) is reflected by a measurement reflection section,and is reflected by the beam splitter section,By a polarization member,only direction components of the polarization member,are extracted from the TM and TE modes, and both waves interfere, whereby a displacement is measured by a displacement measurement section

Interference measurement apparatus and probe used for interference measurement apparatus

An optical system is fabricated in the form of one device, so that the simplified optical system is realized. A displacement is measured with a high resolving power utilizing an interference fringe. An interference measurement probe 2 receives a coherent light from a light source section 1, and divides the coherent light into a plurality of luminous fluxes. The interference measurement probe 2 emits a plurality of irradiation luminous fluxes at different angles. The plurality of irradiation luminous fluxes form an interference fringe and the interference fringe is irradiated onto an objective 8. A light receiving section 3 is disposed at a position where a reflection luminous flux from the objective 8 interferes, and receives an interference light reflected from the objective 8, thereby outputting a light receiving signal which is converted to an electric signal. A measurement section 4 performs processing for obtaining displacement of positions of the interference measurement probe 2 and the light receiving section 3 as well as displacement of the objective 8. A control section 5 is connected to a driving section 6, and controls the driving section 6 based on a measurement result of the measurement section 4, thereby making a stage 7 move in the Z-direction. On the stage 7, the objective 8 is mounted or provided.

Interference measurement apparatus, interference measurement probe and

Provided is a signal formation apparatus for use in an interference measurement which is capable of achieving a simplicity of optical adjustments and a subminiature of the apparatus, as well as a reduction of an influence by a wavelength variation of a laser light to the utmost. A coherent light emitted from a light source section 1 is supplied to a light emission portion 3 via a connection section 2. The light emission portion 3 comprises a straight type incidence waveguide 32, a dividing waveguide 33, emission waveguides 34 and 35, and a phase modulation section 36, which are provided on an optical substrate 31. The light emission portion 3 performs a phase modulation for one of luminous fluxes and emits irradiation luminous fluxes while keeping the other luminous flux as it is. In an irradiation optical portion 4, these irradiation luminous fluxes are collimating and deflected, and irradiated onto a measurement spot of a scale section 5. In the scale section 5, the two luminous fluxes are diffracted into approximately the same direction and incident onto a light receiving portion 6. A light receiving portion 7 convert the received luminous flux to an electrical received signal, and a displacement of the scale section 5 can be obtained by a displacement measurement section 8, based on the received signal.

Signal formation apparatus for use in interference measurement

An optical waveguide portion is provided on one surface of a substrate portion. A luminous flux for measurement is caused to be incident on one end face of the optical waveguide substrate, and only leaking light having passed through the substrate portion is received. The cross-sectional distribution of the refractive index of the optical waveguide portion is measured from changes in the received quantity of light.

Apparatus for measuring cross-sectional distribution of refractive index

A method of patterning an optical device for an optical IC whose purpose is to diffract a light beam incident on one surface of a device substrate to cause a light beam to emerge from another surface of the device. In this method, a layer of a substance of variable refractive index is formed on an optical substrate, coherent light is caused to irradiate the layer from the direction of the normal to the surface which will be the incidence side of the device when it is used or from the opposite side, and coherent light is caused to irradiate the layer from the direction of the normal to the surface which will be the emergence side of the device when it is used or from the opposite side to form an interference pattern on the layer that performs diffraction.

Growing community of inventors

Tokyo, Japan

Shigenori Nagano