Kabushiki Kaisha Toshiba

Shigeki Terada

Mitsuru Ishibashi

Tatsuo Nomaki

Hideyuki Sasaki

Hirofumi Ishii

For the purpose of reducing noise entering from outside and cross talk to a practically negligible extent even when using covered conducting wire made of only conducting wires and insulators, a multi-probe unit has a plurality of probes for contact with a plurality of conductor patterns to be inspected which are aligned side by side, in which every two adjacent ones of the probes for contact with odd-numbered one and even-numbered one of the conductor patterns are positioned in upper and lower levels distant in the thickness direction, and a shield plate of a conductive material having an electrically shielding function is interposed between the upper and lower probes.

Multi probe unit and measuring apparatus comprising thereof

An LC aligning substrate (3) is used for an LCD. The substrate is rubbed with a roller (5). The roller has irregularities on the surface thereof, or instead, one of the roller and substrate is vertically vibrated. As a result, the orientation of molecules at the surface of the substrate is finely changed to conceal sharp changes in the orientation of the surface molecules, thereby preventing the LCD from displaying defective rubbing stripes.

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Higashi-Chichibu-Mura, Japan

Shigeki Terada