Canon Kabushiki Kaisha

Toyo Ink Manufacturing Company

Toyo Ink Mfg. Co., Ltd.

Ihi Corporation

Shigeki Kato

Hidejiro Kadowaki

Makoto Takamiya

Ko Ishizuka

Yasushi Kaneda

Sakae Horyu

Hitoshi Maki

Takayuki Kadoshima

Shinji Ueda

Jun Ashiwa

Yasuhiko Ishida

Mikio Hayashi

Kou Ishizuka

Masayuki Shinohara

Kosaku Tsuji

Yoshimi Kikuchi

Akira Yamamoto

Nobuyuki Kawabata

Hitoshi Hayano

Hideyoshi Nakamura

Takayuki Saeki

Masashi Yamanaka

Kiyohiko Nohara

Hiroshi Kondo

Takashi Seki

Satoshi Ishii

Takuya Shimada

Kenji Kitamura

Koh Ishizuka

Toshikazu Tamura

Takayuki Uozumi

Hiroyuki Hagiwara

Naoki Kawamata

Akimitsu Mochizuki

Shinzo Uchiyama

Osamu Shiromaru

Hiroyuki Shiomi

Katsuhiko Sawamura

Shinichi Azuma

Shoko Goto

Yoshio Muramatsu

Masatoshi Momose

Juichiro Yamada

Yusuke Kasai

Motoi Shitaka

Yasuhiko Hatakeyama

Kyohei Miyajima

A measurement apparatus used for a sorting apparatus for sorting objects includes a scanning unit configured to perform scanning with illumination light which illuminates the object, a control unit configured to control the scanning unit, and a sensor configured to measure reflection light from the illuminated object, wherein the control unit controls the scanning unit to track the object with the illumination light by changing a position of the illumination light in a moving direction of the object and a direction perpendicular to the moving direction.

Sorting apparatus for sorting objects and measurement apparatus

A measuring apparatus includes an optical system configured to project light onto a sample and to receive light via the sample, an imaging device configured to take an image of a light source via the optical system, and a processor configured to obtain an optical characteristic of the sample based on an output of the imaging device. The processor is configured to determine a coefficient of a Wiener filter based on one of the image and a Fourier transform thereof and corresponding one of the light source (an aperture in an aperture unit) and a Fourier transform thereof, and obtain the optical characteristic based on the Wiener filter of which the coefficient has been determined, a Fourier transform of the image, and a Fourier transform of the light source.

Measuring apparatus, measuring method, and program

There is provided a method for constructing a cylindrical tank, including the step of assembling a metal inner tank by individually and sequentially conducting, on an internal side of a PC wall, raising of an inner tank lateral plate by a jack-up unit and welding of a next-stage inner tank lateral plate onto a lower section of the raised inner tank lateral plate, further including the step of installing a guide pair configured to sandwich the raised inner tank lateral plate onto the next-stage inner tank lateral plate that is to be welded therebeneath. As a result, in the case of adopting the jack-up construction system, it is possible to prevent an inner tank lateral plate from being attached next from falling.

Method for constructing cylindrical tank

A measuring apparatus includes an illumination device including a surface light source, a detector configured to detect a light intensity distribution formed on a light-receiving surface by reflected light, and a processor configured to obtain the reflection characteristic based on first data of the light intensity distribution detected by the detector. The processor is configured to estimate, based on the first data, second data of a light intensity distribution formed by specular reflected light and third data of a light intensity distribution formed by diffuse reflected light in a case where a point light source is disposed at each position in a light-emitting region of the surface light source, and to estimate, based on the second data and the third data, a light intensity distribution formed by reflected light from the surface.

Reflection characteristic measuring apparatus

An interferometer comprises: a light source; a first polarization beam splitter configured to reflect, as reference light, a first polarization component of light emitted from the light source, and to transmit, as measurement light, a second polarization component of the light emitted from the light source; a birefringent-material element located between the light source and the first polarization beam splitter; and a light-receiving device configured to receive an interfering light generated by interference of the measurement light transmitted through the first polarization beam splitter, reflected by a reflecting surface to be measured, and transmitted through the first polarization beam splitter, with the reference light reflected by the first polarization beam splitter. The interferometer is configured such that the reference light and the measurement light pass through the birefringent-material element between the first polarization beam splitter and the light-receiving device.

Interferometer

An interferometer of the present invention includes a PBSwhich splits light into reference light and measurement light, a reference mirror which reflects the reference light entering the reference mirror from a first direction, a measurement mirror which reflects the measurement light entering the measurement mirror from a second direction, a lens system which reflected lights from the reference mirror and the measurement light enter, a reflective device which reflects light from the lens system, and a light receiving device which receives multiplexed light, wherein the reference mirror and the measurement mirror are in a conjugate relation with respect to the reflective device, and at least one of the reference mirror and the measurement mirror is tilted so that its normal direction differs from the first and the second direction.

Double pass interferometer with tilted mirrors

An interferometer of the present invention includes a PBSwhich splits light into reference light and measurement light, a reference mirrorwhich reflects the reference light entering the reference mirror from a first direction, a measurement mirrorwhich reflects the measurement light entering the measurement mirror from a second direction, a lens systemwhich reflected lights from the reference mirrorand the measurement lightenter, a reflective devicewhich reflects light from the lens system, and a light receiving devicewhich receives multiplexed light, wherein the reference mirrorand the measurement mirrorare in a conjugate relation with respect to the reflective device, and at least one of the reference mirrorand the measurement mirroris tilted so that its normal direction differs from the first and the second direction.

A first beam having high coherence and a second beam having low coherence and having a central wavelength difference from that of the first beam are multiplexed onto the same optical axis. First and second multiplexed beams obtained by beam splitting are emitted at a measurement reflection plane and a reference plane, respectively. The reflected first and second multiplexed beams are multiplexed and interfere with each other. The interference generates a first interference signal that is obtained from the first beams at the interference unit and that relates to information on the distance to the measurement reflection plane and a second interference signal that is obtained from the second beams. The first and second interference signals are used to carry out calculations for determining the position of a measurement origin for the measurement reflection plane.

Absolute position measurement apparatus

A first beam having high coherence and a second beam having low coherence are multiplexed onto the same optical axis. This multiplexed beam is split into first and second multiplexed beams. The first multiplexed beam is directed towards a measurement reflection plane of an object to be measured, and the second multiplexed beam is directed towards a reference plane. The first and second multiplexed beams that are reflected from the measurement reflection plane and the reference plane, respectively, are multiplexed to cause the first beams to interfere with each other and the second beams to interfere with each other. Calculations are carried out to determine a measurement origin on the basis of the first and second interference signals obtained from the first and second beams, respectively.

Interference measuring apparatus having an optical system for dividing a coherent light beam into two light beams, and causing the divided two light beams to pass along discrete optical paths. The light beams are made into linearly polarized light beams orthogonal to each other and given modulation to the phase of the wave front of at least one of them. The wave fronts of the linearly polarized light beams are superposed one upon the others. A light dividing member divides the light beams superposed one upon the other by the optical system into a plurality of light beams. A polarizing plate takes out each light beam with a 45&#xb0; polarized component, and a plurality of light receiving elements individually receive the light beams taken out by the polarizing plate.

Interference measuring apparatus for detecting a plurality of stable phase difference signals

Interference measuring apparatus for detecting a plurality of different interference phase signals. The apparatus has a light dividing member for dividing linearly polarized light beams superposed one upon another into a plurality of light beams. The apparatus also includes a light transmitting member with a plurality of light passing portions having different light transmitting properties in conformity with the incidence positions of the plurality of light beams divided by the light dividing member. In addition, the apparatus has a polarizing plate to receive the plurality of light beams that passed through the light transmitting member.

Compact interference measuring apparatus for detecting the magnitude and direction of positional deviation

A monoazo lake pigment composition containing a monoazo lake pigment obtained from a laked pigment aqueous slurry prepared by conducting coupling of a diazo component obtained by diazotizing an aromatic amine having a soluble group and a coupler component and conducting laking after or simultaneously with the coupling, wherein the laking is carried out in the presence of a water-soluble acrylic polymer in an amount of 0.1 to 40 parts by weight per 100 parts of the above coupler component, and a gravure ink containing the above pigment composition and a gravure ink vehicle.

Monoazo lake pigment composition and gravure ink using the same

An interferometer or an interference position measuring device is constituted so that a low coherency light source (multi-mode semiconductor layer) or a plurality of light sources with different wavelengths are used as a light source, a light flux is split into two light fluxes in a light transmitting member, one light flux (reference light flux) is emitted to a reference mirror fixed to an optical head, and the other light flux is emitted to an object to be measured which moves or displaces, the respective reflected light fluxes are multiplexed in the transmitting member so that an interference light flux is obtained, a specified wavelength light is extracted by a wavelength selecting filter through which only a specified wavelength light transmits so as to be detected by a light receiving element.

Interferometer and position measuring device

Pigment composition and ink composition using the same

Growing community of inventors

Utsunomiya, Japan

Shigeki Kato