Texas Instruments Corporation

Shian-Wei Aur

Richard Gene Burch

Sharad Saxena

E Ajith Amerasekera

Joseph C Davis

Karthik Vasanth

An operational lifetime, and also performance characteristics, can be accurately predicted for an experimental transistor design ( ) and a specified set of fabrication process conditions ( ), without actually fabricating and testing a physical transistor made according to the particular design data and process conditions. With respect to the prediction of an operational lifetime, the operational lifetime can be expressed as a function of the size of a gate overlap ( ) of the transistor, and this relationship is valid throughout a selected semiconductor technology for which the transistor is designed. The size of the gate overlap is determined by selecting a combinations of values for two process conditions.

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