International Business Machines Corporation

Zilliant Incorporated

Shi Zhong

William C Leipold

Daniel Nelson Maynard

Michael E Scaman

Timothy G Dunham

David L DeMaris

Xingchu Liu

Loren Williams

Reetabrata Mookherjee

To determine pricing recommendations for goods and service products in a business-to-business environment, a set of transaction data corresponding to a set of products are processed to generate a set of pricing recommendations optimized according to an objective. Furthermore, a set of product segments may be determined, transaction data may be associated with one or more of the product segments and a demand model and associated price elasticity may be formulated for one or more of the product segments based upon the transaction data associated with the segment. Using these formulated price elasticities, pricing recommendations for each product may be determined for each of a set of customers. Using an optimization process, price elasticities are used to determine price dependent entity goals for any combination of products, customers and sets of prices, using a mathematical objective function.

Method and system for generating pricing recommendations

A system and method for generating test patterns for a pattern sensitive algorithm. The method comprises the steps extracting feature samples from a layout design; grouping feature samples into clusters; selecting at least one area from the layout design that covers a feature sample from each cluster; and saving each pattern layout covered by the at least one area as test patterns.

System and method for testing pattern sensitive algorithms for semiconductor design

A computer program product for generating test patterns for a pattern sensitive algorithm. The program product includes code for extracting feature samples from a layout design; grouping feature samples into clusters; selecting at least one area from the layout design that covers a feature sample from each cluster; and saving each pattern layout covered by the at least one area as test patterns.

Testing pattern sensitive algorithms for semiconductor design

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Austin, TX, United States of America

Shi Zhong