Taiwan Semiconductor Manufacturing Comp. Ltd.

Shi-Hung Wang

Wei-Li Chen

Chewn-Pu Jou

Kuang-Kai Yen

Fan-ming Kuo

Fu-Lung Hsueh

Yung-Hsu Chuang

Tsung-Hsiung Lee

Shih-Hung Lan

Lee-Chung Lu

Huan-Neng Chen

Yun-Han Lee

Hsieh-Hung Hsieh

Yi-Hsuan Liu

Tsung-Hsiung Li

Tan-Li Chou

Kheng-Guan Tan

The present disclosure relates to a device and method to reduce the dynamic/static power consumption of an MCML logic device. In order to retain register contents during power off mode, an MCML retention latch and flip-flop are disclosed. Retention Latch circuits in MCML architecture are used to retain critical register contents during power off mode, wherein combination logic including clock buffers on the clock tree paths are powered off to reduce dynamic/static power consumption. The MCML retention flip-flop comprises a master latch and a slave latch, wherein a power switch is added to the master latch to power the master latch off during power off mode. The slave latch includes pull-down circuits that remain active to enable the slave latch to retain data at a proper voltage level during power off mode. Other devices and methods are also disclosed.

MCML retention flip-flop/latch for low power applications

A semiconductor wafer includes a plurality of dies. Each of the plurality of dies includes a radio frequency identification (RFID) tag circuit and a coil. The RFID tag circuit includes a tag core, an RF front-end circuit, an ID decoder, a comparator and conductive line for a unique ID. The RF front-end circuit is configured to receive electromagnetic signals through the coil in each of the plurality of dies and to convert the received electromagnetic signals into commands. The ID decoder is configured to receive the commands and to generate an expect ID. The comparator is configured to compare the unique ID with the expect ID to generate a comparison result. The comparison result is arranged to decide if the tag core is configured to receive commands.

Method and apparatus of RFID tag contactless testing

A voltage scaling circuit includes a first critical path and an edge detection unit. The first critical path includes an input and an output. The edge detection unit includes a first input, a second input, a counter and a time-to-digital converter (TDC). The input of the first critical path is electrically connected to the first input of the edge detection unit, and the output of the critical path is electrically connected to the second input of the edge detection unit. The counter is configured to measure a duration between an active edge of a start signal on the first input of the edge detection unit and an active edge of a stop signal on the second input of the edge detection unit in a clock period basis. The TDC is configured to measure a beginning portion and an end portion of the duration.

Method and apparatus of voltage scaling techniques

The present application discloses a method of generating an intellectual property (IP) block design kit including an IP block circuit design and a system-level characteristics table for manufacturing an integrated circuit. According at least one embodiment, the IP block circuit design is generated. The IP block circuit design is simulated based on predetermined configuration sets, and each configuration set has manufacturing options and/or operating conditions. A plurality of system-level models for the predetermined configuration sets are generated based on the simulation of the IP block circuit design. The system-level characteristics table is generated by arranging the predetermined configuration sets and the system-level models in compliance with a system-level characteristics table template of a system-level characteristics modeling device. Then the IP block circuit design and the system-level characteristics table are stored as the IP block design kit.

Method of generating an intellectual property block design kit, method of generating an integrated circuit design, and simulation system for the integrated circuit design

Growing community of inventors

Houli, Taiwan

Shi-Hung Wang