Fih (hong Kong) Limited

Shenzhen Futaihong Precision Industry Co., Ltd.

Shenzhen Yinwang Intelligent Technologies Co., Ltd.

Sheng Wu

Jin-Shan Cui

Ming Li

Jian-Ping Jin

Hong-Wei Zhang

Jer-Sheng Lee

Qiang Mei

San-Yan Zhang

Weiran Nie

Chengming Liu

A flatness measuring apparatus includes a measuring assembly and a movable assembly. The measuring assembly includes a measuring unit. The measuring unit includes a supporting base, a loading block, and a limiting block mounted above the supporting base. The supporting base defines a receiving hole. The loading block is removably received in the receiving hole. The loading block is coplanar with the supporting base and cooperatively defines a limiting channel. A distance between the limiting block and the supporting base is substantially the same as a maximum allowable height of a workpiece, thereby only allowing qualified workpieces to slide therethrough and catching unqualified workpieces. The movable assembly connects to the measuring assembly to drive the loading block to disengage from the receiving hole and make the unqualified workpieces drop down from the measuring unit.

Flatness measuring apparatus

A suction head structure () and a vacuum cleaner () using the same for adsorbing grains is provided. The suction head structure includes an accommodating room (), a plurality of suction tubes (), an eject tube (), and an air inlet (). The accommodating room is configured for accommodating grains therein. The suction tubes connect with the accommodating room. Each of the plurality of suction tubes is configured for adsorbing grain into the accommodating room. The eject tube connects with the accommodating room. The eject tube is configured for ejecting grains accommodated in the accommodating room. The air inlet connects with the eject tube. The air inlet is configured for injecting cool air into the eject tube.

Suction head structure and vacuum cleaner using the same

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Shenzhen, China

Sheng Wu