Mediatek Corporation

Sheng-Wei Lei

Chang-Lin Wei

Ying-Chou Shih

Yi-Chieh Lin

Jing-Hui Zhuang

Che-Hsien Huang

Yen-Ju Lu

Po-Sen Tseng

Yeh-Chun Kao

Wun-Jian Lin

Shih-Chia Chiu

Chih-Yang Liu

This disclosure provides a test kit for testing a device under test (DUT) including a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having a nest and an interposer substrate installed under the nest.

Test kit for testing a device under test

A test kit for testing a device under test (DUT) includes a socket structure for containing the DUT, and a plunger assembly detachably coupled with the socket structure. The plunger assembly includes a multi-layered structure having at least an interposer substrate sandwiched by a top socket and a nest.

A test kit for testing a device under test (DUT) includes a socket structure for containing the DUT. The DUT includes an antenna and radiates a RF signal. The test kit further includes a reflector having a lower surface. The RF signal emitted from the antenna of the DUT is reflected by the reflector and a reflected RF signal is received by the antenna of the DUT.

Growing community of inventors

Hsinchu, Taiwan

Sheng-Wei Lei