Industrial Technology Research Institute

Shen-Chuan Lo

Ming-Wei Lai

Li-Jiaun Lin

Ming-Shan Jeng

Fanghei Tsau

Jie-Ren Ku

Chun-Ju Huang

Pei-Shan Yen

Tu Chen

Mei-Lun Wu

Shi-Ri Lee

Bin-Hao Chen

A sample holding device for studying light-driven reactions and a sample analysis method using the same are disclosed. The sample holding device comprises a main body, a supporting structure and a light source assembly. The main body has a channel which has a first end and a second end opposite to the first end, and a focusing lens which is located on the second end. The supporting structure is located on one end of the main body for sample supporting. The light source assembly is detachably disposed on the other end opposite to the end which is disposed with the supporting structure. The light source assembly emits a light beam into the first end of the channel. The light beam then irradiates the sample which locates on the supporting structure after passing through the focusing lens.

Sample holding device for studying light-driven reactions and sample analysis method using the same

A carrier assembly and an operation method thereof are provided. The carrier assembly comprises a base, a first gear element, a second gear element, an object-carrier and a fixing part. The first gear element is rotatably disposed on the base, and the second gear element is rotatably disposed on the base and meshed with the first gear element. The object-carrier is used for carrying an object. The fixing part connects the base to a carrier platform. Wherein, an included angle is contained between the rotating axis of the first gear element and the rotating axis of the second gear element.

Carrier assembly of microscope element and operation method thereof

A method of processing objects by a FIB (Focused Ion Beam) system and a carrier used therewith are provided. The carrier includes a carrying member and a processing portion having an object disposed thereon. Before the carrier is disposed into the FIB system, the carrying member is set to be flush in height with the processing portion having the object disposed thereon. After an eucentric height adjustment inside the FIB system, both the carrying member and the processing portion are in a same plane with the eucentric point of the system. Therefore, after the object on the processing portion is processed, a processed object or a processed block of the object can be moved to the carrying member without performing further eucentric height adjustment with respect to the carrying member.

Method of processing objects by focused ion beam system and carrier used therewith

The invention utilizes a carbon nano material to nanotize a magnesium-based hydrogen storage material, thereby forming single or multiple crystals to enhance the surface to volume ratio and hydrogen diffusion channel of the magnesium-based hydrogen storage material. Therefore, the hydrogen storage material has higher hydrogen storage capability, higher absorption/desorption rate, and lower absorption/desorption temperature.

Nanotization of magnesium-based hydrogen storage material

Growing community of inventors

Hsinchu, Taiwan

Shen-Chuan Lo