Ut-battelle, Inc.

Siemens Medical Solutions Usa, Inc.

Shaun S Gleason

Hamed Sari-Sarraf

Michael J Paulus

Ziad Burbar

Clarence E Thomas

Philip R Bingham

Kenneth William Tobin, Jr

James Samuel Goddard, Jr

James Allen Mullens

Shikui Yan

Christopher J Mann

David L Bond

Michael L Baker

Kimberly B Jeskie

Martin A Hunt

Sam Griffin

Gregory L Capps

Jeff W Smith

Robert A Franklin

A system and method that provides access to remote data locally by identifying and downloading linked content from a plurality of remote sources through a communication network; decomposing the downloaded content into local content elements by intercepting links between the content elements and mapping the intercepted links to redirected links that locate the same download content in a local cache or a local server proxy; identifying remote devices requesting access to the local cache or the local server proxy and the device's functionality through a tracking code stored on the remote devices and a probabilistic tracking; and providing access to the local cache or the local server proxy in response to authorizations associated with the identified devices and a user.

Resolution system that provides access to remote data locally

A device for imaging system warp correction includes an object including an imaging phantom, the object being configured for placement of the imaging phantom adjacent a scanning interface of a detector, and a mounting cap coupled to the object and configured to be secured to the detector to establish the placement of the imaging phantom adjacent the scanning interface of the detector. The mounting cap includes a plurality of alignment features configured to align the object and the mounting cap.

Imaging system warp correction with phantom assembly

An optical system performs imaging in a transmissive and reflective mode. The system includes an optical interferometer that generates interference phenomena between optical waves to measure multiple distances, thicknesses, and indices of refraction of a sample. Measurements are made through a galvanometer that scans a pre-programmed angular arc. An excitation-emission device allows an electromagnetic excitation and emission to pass through an objective in optical communication with the sample. An electromagnetic detector receives the output of the optical interferometer and the excitation-emission device to render a magnified three dimensional image of the sample.

Quantitative phase-imaging systems

A method and related system for generating motion corrected tomographic images includes the steps of illuminating a region of interest (ROI) to be imaged being part of an unrestrained live subject and having at least three spaced apart optical markers thereon. Simultaneous images are acquired from a first and a second camera of the markers from different angles. Motion data comprising 3D position and orientation of the markers relative to an initial reference position is then calculated. Motion corrected tomographic data obtained from the ROI using the motion data is then obtained, where motion corrected tomographic images obtained therefrom.

System and method for generating motion corrected tomographic images

A method for identification of anomalous structures, such as defects, includes the steps of providing a digital image and applying fractal encoding to identify a location of at least one anomalous portion of the image. The method does not require a reference image to identify the location of the anomalous portion. The method can further include the step of initializing an active contour based on the location information obtained from the fractal encoding step and deforming an active contour to enhance the boundary delineation of the anomalous portion.

Method for non-referential defect characterization using fractal encoding and active contours

Automatic detection of defects during the fabrication of semiconductor wafers is largely automated, but the classification of those defects is still performed manually by technicians. This invention includes novel digital image analysis techniques that generate unique feature vector descriptions of semiconductor defects as well as classifiers that use these descriptions to automatically categorize the defects into one of a set of pre-defined classes. Feature extraction techniques based on multiple-focus images, multiple-defect mask images, and segmented semiconductor wafer images are used to create unique feature-based descriptions of the semiconductor defects. These feature-based defect descriptions are subsequently classified by a defect classifier into categories that depend on defect characteristics and defect contextual information, that is, the semiconductor process layer(s) with which the defect comes in contact. At the heart of the system is a knowledge database that stores and distributes historical semiconductor wafer and defect data to guide the feature extraction and classification processes. In summary, this invention takes as its input a set of images containing semiconductor defect information, and generates as its output a classification for the defect that describes not only the defect itself, but also the location of that defect with respect to the semiconductor process layers.

Context-based automated defect classification system using multiple morphological masks

A method for ultra-high resolution computed tomography imaging, comprising the steps of: focusing a high energy particle beam, for example x-rays or gamma-rays, onto a target object; acquiring a 2-dimensional projection data set representative of the target object; generating a corrected projection data set by applying a deconvolution algorithm, having an experimentally determined a transfer function, to the 2-dimensional data set; storing the corrected projection data set; incrementally rotating the target object through an angle of approximately 180&deg;, and after each the incremental rotation, repeating the radiating, acquiring, generating and storing steps; and, after the rotating step, applying a cone-beam algorithm, for example a modified tomographic reconstruction algorithm, to the corrected projection data sets to generate a 3-dimensional image. The size of the spot focus of the beam is reduced to not greater than approximately 1 micron, and even to not greater than approximately 0.5 microns.

Ultra-high resolution computed tomography imaging

At least two linear arrays of x-ray detectors are placed below a conveyor belt in a poultry processing plant. Multiple-energy x-ray sources illuminate the poultry and are detected by the detectors. Laser profilometry is used to measure the poultry thickness as the x-ray data is acquired. The detector readout is processed in real time to detect the presence of small highly attenuating fragments in the poultry, i.e., bone, metal, and cartilage.

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Oak Ridge, TN, United States of America

Shaun S Gleason