Entit Software LLC

Micro Focus Lcc

Sharon Lin

Inbar Shani

Ilan Shufer

Sigal Ishay

Adi Godkin

Elad Avraham

Elad Azulay

Yael Oshri

Automated test failures that result from automated testing of program code under development are windows to include just the automated test failures occurring for a first time and that are due to automated test code defects or program code defects. The automated test failures that remain after winnowing are clustered into automated test failure clusters that each individually corresponding to a different automated test code defect or a different program code defect. The automated test failure clusters are window to include just the automated test failure clusters that each individually correspond to a different program code defect. The automated test failure clusters that remain after winnowing are output.

Automated testing of program code under development

In some examples, a method may include receiving, by a system comprising a processor, for a first invocation of a first test of a plurality of code coverage tests run at overlapping times, a first report indicating a first subset of files of application code covered by the first test. The method may include generating, by the system, a test-to-file map associating the first subset of files to the first test. The method may include receiving, by the system, a second report indicating a second subset of files of the application code covered by a second invocation of the first test. The method may include modifying, by the system, the test-to-file map to associate the second subset of files to the first test.

Code coverage testing utilizing test-to-file maps

An example method for handling dependencies between feature flags can include defining, by a processing resource executing instructions, dependencies between a plurality of feature flags in a process executable by the processing resource. The method can include enforcing, by the processing resource executing instructions, the dependencies during activation of a first feature by a determination of validity of utilization of a feature flag as a switch for a second feature.

Dependencies between feature flags

Growing community of inventors

Yehud, Israel

Sharon Lin