Texas Instruments Corporation

Sharat Chandra Rudrasamudram

Rahul Vijay Kulkarni

Vivek Varier

Akhilesh Kesavanunnithan

Siva Reddy Vemireddy

Henry Manoj D'Souza

Methods and apparatus for determining non-linearity in analog-to-digital converters are disclosed. An example apparatus includes a signal interface to receive an output of an analog-to-digital converter (ADC), the output corresponding to a periodic signal transmitted to the ADC; a signal transformer to determine at least one of a harmonic phase or a harmonic amplitude corresponding to the output; and an integral non-linearity (INL) term calculator to determine the INL of the ADC based on a characteristic of the periodic signal and the at least one of the harmonic phase or the harmonic amplitude.

Methods and apparatus to determine non linearity in analog-to-digital converters

Disclosed examples include a method and automated test system for testing an ADC. The method includes computing an ADC noise value based on a first set of data values sampled while the ADC input terminals are shorted, computing a first system noise value based on a second set of data values sampled while a test circuit signal source applies zero volts to the ADC through a signal chain, computing a signal chain noise value based on the first system noise value and the ADC noise value, computing a measured SNR value based on a third set of data values sampled while the test circuit signal source applies a non-zero source voltage signal to the signal chain, computing a second system noise value based on the measured SNR value, and computing an ADC SNR value based on the second system noise value and the signal chain noise value.

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Bengaluru, India

Sharat Chandra Rudrasamudram