Dell & Products L.p.

Sharada Desai

Abhishek Mishra

Vivek Bhargava

Kumar Saurav

An apparatus comprises a processing device configured to determine specifications for an information technology asset to be developed, and to identify, utilizing at least one machine learning model, whether at least one of the specifications for the information technology asset is defect-prone, wherein a given specification is identified as defect-prone responsive to at least one output of the at least one machine learning model indicating that the given specification has at least a threshold likelihood of resulting in one or more defects during development of the information technology asset. The processing device is also configured to establish a mapping between the one or more identified defect-prone specifications for the information technology asset and one or more components of the information technology asset, and to modify one or more development processes for the information technology asset based at least in part on the established mapping.

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Bengaluru, India

Sharada Desai