Keysight Technologies, Inc.

Shao-Bo Chen

Ya Jing

Hong-Wei Kong

Zhu Wen

Yu Zuo

A testing system includes a test chamber including an array of spaced-apart probe antennas and a positioner configured to support a device under test (DUT) having an array of digital antenna elements, a radio frequency (RF) signal generator and analyzer configured to send and receive RF test signals to/from the spaced-apart probe antennas, and an RF switch component configured to selectively couple the RF signal generator and analyzer to the array of spaced-apart probe antennas within the test chamber. A digital test instrument includes at least one digital signal generator and analyzer configured to generate digital test signals to the digital antenna elements of the DUT in a transmitter test mode, and to analyze received digital test signals from the digital antenna elements of the DUT in a receiver test mode, a programmable hardware device configured to implement a custom digital fiber interface protocol for the generated and received digital test signals, and a digital fiber interface configured to couple the programmable hardware device to the array of digital antenna elements of the DUT and transceive the digital test signals to/from the array of digital antenna elements of the DUT. A synchronization module is configured to synchronize the RF signal generator and analyzer, and the digital test instrument. A test controller is configured to control operation of the positioner, the RF signal generator and analyzer, the RF switch component and the digital test instrument during testing of the DUT.

Systems and methods for test and calibration of MIMO antenna arrays including a digital interface

A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.

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Fuzhou, China

Shao-Bo Chen