Sun Microsystems, Inc.

Shanker Bhagvat

David J Greenhill

Curtis Roger McAllister

Thomas R Caron

An integrated circuit test system. The test system includes a controller and an integrated circuit coupled to a voltage source and a current monitor. The controller causes the voltage source to supply a voltage to the integrated circuit, receives a signal from the current monitor indicating a power dissipation of the integrated circuit, and causes the voltage source to reduce the voltage until the signal from the current monitor indicates the power dissipation of the integrated circuit is less than a predetermined threshold. The controller stores in the integrated circuit in a non-volatile storage register that is accessible via a subset of access pins, a value corresponding to the voltage supplied to the integrated circuit when the power dissipation of the integrated circuit is less than the predetermined threshold. The subset of access pins provides at least one function in addition to accessing the non-volatile storage register.

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San Jose, CA, United States of America

Shanker Bhagvat