Corning Incorporated

Shane David Seyler

Timothy Michael Gross

Sinue Gomez

Zhongzhi Tang

Lisa Anne Tietz Moore

Douglas Dale Bressler

Jason Scott Stewart

Rebecca Marie Connors

Mark Lee Humphrey

David William Folmar

A laminate includes a first glass article having a first thickness, a first annealing point (T), and a first softening point (T), a second glass article having a second thickness, a second annealing point (T), and a second softening point (T), and an interlayer disposed between the first glass article and the second glass article. The first thickness is greater than the second thickness, the second annealing point (T) is less than or equal to the first annealing point (T), and the second softening point (T) is greater than the first softening point (T).

Uniformly pair sagged glass articles and hybrid laminates

A laminate includes a first glass article having a first thickness, a first annealing point, and a first softening point, a second glass article having a second thickness, a second annealing point, and a second softening point, and an interlayer disposed between the first glass article and the second glass article. The first thickness is greater than the second thickness, the second annealing point is less than or equal to the first annealing point, and the second softening point is greater than the first softening point.

Methods are provided for solving a process function for modification of a non-test die for use in extrusion of a honeycomb body. The process function is solved by comparing measured widths of a plurality of slots between pins of a test die in the post-removal state and measured widths of a plurality of slots between pins of the test die in the pre-removal state. Methods are also provided for modifying a non-test die for use in extrusion of a honeycomb body. Such methods remove non-test-die material from a plurality of pins of the non-test die based on application of the process function.

Method of solving a process function for manufacturing an extrusion die

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Corning, NY, United States of America

Shane David Seyler