Lemon Inc.

Beijing Youzhuju Network Technology Co., Ltd.

Shan Lu

Jian Wang

Qi Chen

Junmou Zhang

Yimin Chen

Chuang Zhang

Yuanlin Cheng

Dongrong Zhang

Longfei Bai

Zhilin Xu

An on-chip integrated circuit, a data processing device and a method are provided. The on-chip integrated circuit includes: a processor circuit and an accelerator circuit. The processor circuit includes a processor and a data storage area, the processor is connected to the data storage area through a first bus in the processor circuit. The accelerator circuit includes an accelerator and a second bus, the accelerator is connected to the second bus, and the second bus is bridged with the first bus corresponding to the data storage area, to perform data interaction between the accelerator and the data storage area, which can reduce the congestion on a bus of the processor and improve the quality of service of the application.

On-chip integrated circuit, data processing device, and data processing method

A storage circuit, a chip, a data processing method, and an electronic device are disclosed. The storage circuit includes: an input control circuit and a memory. The input control circuit is configured to: receive n input data and an input control signal; perform first data processing on the n input data based on the input control signal to obtain n intermediate data corresponding to the n input data one by one; and write the n intermediate data and a sign signal corresponding to the n input data into the memory; the memory is configured to store the n intermediate data and the sign signal; different values of the sign signal respectively represent different processing processes of the first data processing, and n is a positive integer.

Storage circuit, chip, data processing method, and electronic device

Disclosed are a temperature measurement circuit and method. The circuit includes a first temperature sensing circuit, a second temperature sensing circuit and a data processing unit. The first temperature sensing circuit is configured to generate a first measurement signal for characterizing a temperature based on an inputted first current signal, a magnitude of the first current signal being correlated to temperature. The second temperature sensing circuit is configured to generate a second measurement signal for characterizing the temperature based on an inputted second current signal, the second current signal being independent of temperature. The data processing unit is configured to determine a current temperature based on a first characteristic parameter corresponding to the first measurement signal and a second characteristic parameter corresponding to the second measurement signal.

Temperature measurement circuit and method

A apparatus, method, system and medium are provided. The apparatus includes: a buffer chain, including N first buffers connected end to end, N first AND gates with one input connected to a pulse signal and the other input connected to an output of a corresponding first buffer, and N flip-flops coupled with outputs of respective first AND gates; a path time delay adjustment circuit, with an input receiving a pulse signal, and an output connected to an input terminal of the first buffer; a control apparatus, controlling the time delay produced by the adjustment circuit to be reduced by at least one step from a preset time delay during each adjustment until an output of a Pflip-flop flips; a measuring device measuring the pulse signal's width according to an output of each flip-flop, the time delay of each first buffer and the time delay of the adjustment circuit.

Apparatus, method, system and medium for measuring pulse signal width

A voltage detection circuit and method for an integrated circuit, and an integrated circuit are provided. The voltage detection circuit includes: a first current source, a first branch and a second branch. A current outputted by the first current source is allocated to the first branch and the second branch. The first branch includes a first voltage control current component and a first load connected in series. The second branch includes a current signal detection component and a second load connected in series. A voltage signal to be detected is inputted to a control signal input terminal of the first voltage control current component. The current signal detection component is configured to output, in real time, a preset signal characterizing a second current flowing through the second branch, to determine change of the voltage signal to be detected based on the preset signal.

Voltage detection circuit and method for integrated circuit, and integrated circuit

An integrated circuit, and a data processing device and method are provided. The integrated circuit includes a processor circuit and an accelerator circuit. The processor circuit includes a processor, a first data storage section, and a first data input/output interface. The accelerator circuit includes an accelerator and a second data input/output interface. The second data input/output interface is electrically connected to the first data input/output interface, so that the accelerator circuit can perform information interaction with the first data storage section.

Integrated circuit, data processing device and method

The application provides an apparatus, a system, a detector and a detection method for power supply voltage detection. The apparatus connected to an integrated circuit power supply network comprises: a power supply voltage detector, comprising: N buffers, wherein an input terminal of a first buffer is connected to a clock signal, and output terminals of other buffers are connected to the input terminal of an adjacent buffer; N latch chains, each of which comprises M latches, wherein a clock input terminal of each latch is connected to a clock signal, a D terminal of a first latch of each latch chain is connected to the output terminal of a corresponding buffer, and Q terminals of other latches are connected to the D terminal of an adjacent latch, wherein M and N are positive integers, the VDD terminal of each latch is connected to an area in an integrated circuit power supply network where a power supply voltage is to be detected, and a grounding terminal of each latch is connected to a ground; and a voltage regulation module connected to the Q terminal of each latch and configured to detect data output of each latch to determine a magnitude of a power supply voltage.

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Los Angeles, CA, United States of America

Shan Lu