Tpo Displays Corporation

Shan-Hung Tsai

Ming-Hsien Sun

An Shih

Chih-Hung Peng

Yi Chun Yeh

Tsung-Yen Lin

Chien-Peng Wu

A method of forming a display device is provided. The method includes the following steps: providing a substrate which includes a driving circuit region and a pixel region; forming a first island and a second island in the driving circuit region on the substrate with a semiconductor material; performing a first ion implantation process to dope ions into both of the first island and the second island; forming a first patterned mask on the substrate to cover the second island and expose a part of the first island; performing a second ion implantation process by using the first patterned mask as a mask to form a first source/drain region in the first island; removing the first patterned mask; forming a first gate and a second gate on the first island and the second island respectively; forming a second patterned mask on the substrate to cover the first island and expose a part of the second island; and performing a third ion implantation process by using both of the second patterned mask and the second gate as a mask to form a second source/drain region in the second island. The first island, the first source/drain region, and the first gate form a NMOS device, and the second island, the second source/drain region, and the second gate form a PMOS device.

Method of forming a display device by using separate masks in forming source and drain regions of MOS transistors

A method of testing a drive circuit including a scan line drive circuit and a data line drive circuit for driving a display is disclosed. The display may include a plurality of scan lines and a plurality of data lines, each of said scan lines including an initial terminal coupled to said scan line drive circuit, each of said data lines including an initial terminal coupled to said data line drive circuit. The method includes: coupling each of said scan lines and each of said data lines to a first testing pad and a second testing pad respectively; sending a first testing signal to an input terminal of said scan line drive circuit and sending a second testing signal to an input terminal of said data line drive circuit; and testing at said first testing pad and said second testing pad respectively.

Method for testing drive circuit, testing device and display device

A pixel testing method is provided. The pixel testing method is adapted to measure device parameters within each pixel of a display. Before plating a lighting device into each pixel, a capacitor is formed such that one end of the capacitor is connected to an open-circuit terminal of an electronic device while the other end of the capacitor is connected to an added common line (or the original scan line or data line of the display). The parameters of the electronic device connected to the lighting device are tested through a charging/discharging of the capacitor so that all the devices within a pixel can be tested before forming organic functional layer in every pixel.

AM-OEL display, electronic system comprising the AM-OEL display and a testing method thereof

A method and an apparatus for testing a plurality of driver circuits of an AMOLED before OLEDs are implanted are provided. The method and the apparatus select one specific driver circuit to be tested and dispose a conductive board above the array glass of the OLED to form a capacitor. By using the data line, the scan line, and the power line of an AMOLED, the present invention is able to input and retrieve signals from driver circuits for analyzing each of them is normal or not.

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Taichung, Taiwan

Shan-Hung Tsai