International Business Machines Corporation

Tsinghua University

Shan Gu

Cheng Fang Wang

Qing Ql Li

Dong Xiang

Jiaguang Sun

Shuang Men

Zhan Wei Wang

Qian Xia Song

Mingjing Chen

Li Hua Zhao

A method, system, and computer program product for data reorganization and logs reorganization. The method includes receiving, by one or more processing units, original data. The method also includes classifying, by the one or more processing units, the original data into different types based on a trained type classification model. The method also includes generating, by the one or more processing units, at least one severity for at least part of the original data based on a trained severity classification model, the at least part of the original data corresponding to at least one type. The method also includes outputting, by the one or more processing units, at least one message, the at least one message indicating the severity of the at least part of the original data.

Data reorganization

A method and apparatus for scan design architecture with non-scan testing cost is disclosed. In one embodiment, the method comprises: transforming a plurality of sequential cells for a sequential circuit to a plurality of controllable and observable cells for a combinational circuit; connecting said plurality of sequential cells with at least one shifter registers; obtaining at least one scan chains; and substituting the ATPG step for said sequential circuit with the ATPG for said combinational circuit. In another embodiment, the apparatus comprises: means for transforming a plurality of sequential cells for a sequential circuit to a plurality of controllable and observable cells for a combinational circuit; means for connecting said plurality of sequential cells with at least one shifter registers; means for obtaining at least one scan chains; and means for substituting the ATPG step for said sequential circuit with the ATPG for said combinational circuit.

Cost-effective scan architecture and a test application scheme for scan testing with non-scan test power and test application cost

Growing community of inventors

Beijing, China

Shan Gu