Growing community of inventors

New Delhi, India

Shaleen Bhabu

Average Co-Inventor Count = 3.17

ph-index = 5

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 54

Shaleen BhabuVivek Chickermane (10 patents)Shaleen BhabuSenthil Arasu Thirunavukarasu (10 patents)Shaleen BhabuJoseph Michael Swenton (1 patent)Shaleen BhabuSameer Chakravarthy Chillarige (1 patent)Shaleen BhabuThomas Webster Bartenstein (1 patent)Shaleen BhabuRatan Deep H Singh (1 patent)Shaleen BhabuNilabha Dev (1 patent)Shaleen BhabuBambuda Chen Chien Leung (1 patent)Shaleen BhabuSameer H Chakravarthy (1 patent)Shaleen BhabuShaleen Bhabu (12 patents)Vivek ChickermaneVivek Chickermane (55 patents)Senthil Arasu ThirunavukarasuSenthil Arasu Thirunavukarasu (10 patents)Joseph Michael SwentonJoseph Michael Swenton (20 patents)Sameer Chakravarthy ChillarigeSameer Chakravarthy Chillarige (11 patents)Thomas Webster BartensteinThomas Webster Bartenstein (10 patents)Ratan Deep H SinghRatan Deep H Singh (1 patent)Nilabha DevNilabha Dev (1 patent)Bambuda Chen Chien LeungBambuda Chen Chien Leung (1 patent)Sameer H ChakravarthySameer H Chakravarthy (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Cadence Design Systems, Inc. (11 from 2,542 patents)

2. Other (1 from 832,680 patents)


12 patents:

1. 8719651 - Scan chain diagnostic using scan stitching

2. 8595681 - Method and apparatus to use physical design information to detect IR drop prone test patterns

3. 8584074 - Testing to prescribe state capture by, and state retrieval from scan registers

4. 8438528 - Method and apparatus to use physical design information to detect IR drop prone test patterns

5. 8429593 - Method and apparatus to use physical design information to detect IR drop prone test patterns

6. 8392868 - Method and apparatus to use physical design information to detect IR drop prone test patterns

7. 8336019 - Method and apparatus to use physical design information to detect IR drop prone test patterns

8. 8286123 - Method and apparatus to use physical design information to detect IR drop prone test patterns

9. 8190953 - Method and system for selecting test vectors in statistical volume diagnosis using failed test data

10. 7944285 - Method and apparatus to detect manufacturing faults in power switches

11. 7886263 - Testing to prescribe state capture by, and state retrieval from scan registers

12. 7877715 - Method and apparatus to use physical design information to detect IR drop prone test patterns

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as of
12/5/2025
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