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San Diego, CA, United States of America

Shaker Sarwary

Average Co-Inventor Count = 5.36

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 48

Shaker SarwaryMohammad Homayoun Movahed-Ezazi (4 patents)Shaker SarwaryParas Mal Jain (2 patents)Shaker SarwaryFadi Maamari (2 patents)Shaker SarwaryMaher Mneimneh (2 patents)Shaker SarwaryNamit Gupta (2 patents)Shaker SarwarySridhar Gangadharan (2 patents)Shaker SarwaryAshish Bansal (2 patents)Shaker SarwaryBernard Murphy (1 patent)Shaker SarwarySubir Chandra Ray (1 patent)Shaker SarwaryJun Yuan (1 patent)Shaker SarwaryAshish Hari (1 patent)Shaker SarwarySubir Subir Ray (1 patent)Shaker SarwaryParas Mal Jain (1 patent)Shaker SarwaryShaker Sarwary (5 patents)Mohammad Homayoun Movahed-EzaziMohammad Homayoun Movahed-Ezazi (15 patents)Paras Mal JainParas Mal Jain (13 patents)Fadi MaamariFadi Maamari (12 patents)Maher MneimnehMaher Mneimneh (9 patents)Namit GuptaNamit Gupta (7 patents)Sridhar GangadharanSridhar Gangadharan (5 patents)Ashish BansalAshish Bansal (2 patents)Bernard MurphyBernard Murphy (6 patents)Subir Chandra RaySubir Chandra Ray (1 patent)Jun YuanJun Yuan (1 patent)Ashish HariAshish Hari (1 patent)Subir Subir RaySubir Subir Ray (1 patent)Paras Mal JainParas Mal Jain (1 patent)
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Inventor’s number of patents
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Strength of working relationships

Company Filing History:

1. Atrenta, Inc. (5 from 47 patents)


5 patents:

1. 8856706 - System and method for metastability verification of circuits of an integrated circuit

2. 8788993 - Computer system for generating an integrated and unified view of IP-cores for hierarchical analysis of a system on chip (SoC) design

3. 8533647 - Method for generating an integrated and unified view of IP-cores for hierarchical analysis of a system on chip (SoC) design

4. 8448111 - System and method for metastability verification of circuits of an integrated circuit

5. 7536662 - Method for recognizing and verifying FIFO structures in integrated circuit designs

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