Yissum Research Development Company of the Hebrew University of Jerusalem Ltd.

Hil Applied Medical, Ltd.

Shai Tsipshtein

Evgeny Papeer

Assaf Shaham

Ynon Hefets

Eilon Sherman

Indranuj Dey

Alexander Bespaly

A system and method are presented, for monitoring and/or imaging of a sample. The system comprises: a light unit configured for illuminating the sample in at least two different wavelength ranges; a collection unit configured for collecting a light emitted from the sample in at least a third wavelength range and directing said emitted light towards at least one detector; and an activation unit configured for providing activation signal to selectively activate at least a portion of fluorescent substance in the sample; and a processing circuitry configured for operating the light unit to determine a selected temporal illumination profile of said at least two different wavelength ranges and for operating the activation unit for controllable activation.

System and method for use in fret microscopy

Disclosed are systems and methods for generating a beam of charged particles, such as an ion beam. Such a system may comprise an interaction chamber configured to support a target, one or more electromagnetic radiation sources, a sensor, and at least one processor. The one or more electromagnetic radiation sources may be configured to provide a probe beam at a first energy for determining orientation data of the target and a particle-generating beam at a second energy, which is greater than the first energy, for producing a beam of charged particles. The processor may be configured to receive feedback information from the sensor and to cause a change in a relative orientation between the particle-generating beam and the target.

Systems and methods for providing a beam of charged particles

Growing community of inventors

Jerusalem, Israel

Shai Tsipshtein