Samsung Electronics Co., Ltd.

Seungyou Baek

Jeongho Lee

Youngsik Kim

Youngkwang Yoo

Younggeun Lee

Eunchu Oh

Yena Lee

A memory controller for controlling a memory operation of a memory device includes: an error correction code (ECC) circuit configured to detect an error of first read data read from the memory device and correct the error; an error type detection logic configured to write first write data to the memory device, compare second read data with the first write data, detect an error bit of the second read data based on a result of the comparing, and output information about an error type identified by the error bit; and a data patterning logic configured to change a bit pattern of input data to reduce an error of the second read data based on the information about the error type.

Memory controller, memory system including the same, and method of operating the memory controller

An operating method of a memory device, which includes a first memory region and a second memory region, includes reading first data from the first memory region and storing the read first data in a data buffer block, performing a first XOR operation on the first data provided from the data buffer block and second data read from the second memory region to generate first result data, writing the first data stored in the data buffer block in the second memory region, performing a second XOR operation on the first data and the first result data to generate the second data, storing the generated second data in the data buffer block, and writing the second data stored in the data buffer block in the first memory region.

Memory device for swapping data and operating method thereof

Growing community of inventors

Suwon-si, South Korea

Seungyou Baek