Korea Advanced Institute of Science and Technology

Samsung Electronics Co., Ltd.

Lg Electronics Inc.

University of Ulsan Foundation for Industry Cooperation

The Asan Foundation

Seungryong Cho

Young Hun Sung

Hyeongseok Kim

Miran Park

Changhwan Kim

Hoyeon Lee

Taehyung Kim

Sang Wook Lee

Jae Hak Lee

Sangjun Park

Jong Ha Lee

Ji Young Choi

Jung Won Kwak

Chung Hwan Lee

Namuk Kim

Jiyoung Choi

Byung Chul Cho

Mikiko Ito

Jongha Lee

Youngjun Jung

Byungkee Lee

Yunjeong Lee

Jeongtae Soh

Jonghwan Min

An X-ray imaging apparatus includes an X-ray generator including a plurality of X-ray sources, an X-ray detector configured to detect X-rays radiated from the plurality of X-ray sources and generate a plurality of pieces of projection data, and a processor configured to apply log projection to each of the plurality of pieces of projection data, to apply weighted projection to the log-projected projection data, to apply a bidirectional ramp filter to the weighted-projected projection data, and to generate a tomographic image reconstructed based on each of the projection data to which the bidirectional ramp filter is applied.

X-ray imaging apparatus and X-ray image processing method

An embodiment of the present disclosure provides a method of generating a tomography image and an X-ray imaging apparatus operating according to the method, whereby when a material with a high X-ray attenuation rate is inserted into an object, an image quality may be improved by reducing ripple artifacts and/or undershoot artifacts that may occur in a tomography image that is a captured X-ray image of the object.

Method for generating tomographic image and X-ray imaging apparatus according to same

Disclosed are a method, an apparatus, and a system for inspecting a ball grid array-type semiconductor chip package. A first embodiment of the present invention provides an apparatus for inspecting a semiconductor chip package, the apparatus comprising: a first image acquisition unit for acquiring a reference image using a three-dimensional image of a semiconductor chip serving as a reference, the reference image being obtained by removing a region of interest from the three-dimensional image; a second image acquisition unit for acquiring a two-dimensional image of a semiconductor chip to be inspected; and an image processing unit for deriving an image of a region of interest of the semiconductor chip to be inspected, from the difference between the reference image and the two-dimensional image.

Method for inspecting ball grid array-type semiconductor chip package

A method of reducing an artifact by using structural similarity. The method includes at least: obtaining a plurality of input Computed Tomography (CT) images including a first CT image and a second CT image, generating an artifact map in which anatomical information is removed and artifacts information is remained, by subtracting the second. CT image from the first CT image, generating, by the computer, a structural similarity map between each CT image and the artifact map, and generating, by the computer, a final reconstructed image by comparing particular parts on images of a plurality of structural similarity maps with each other and selecting data of an input CT image which has been used to generate a particular part of a structural similarity map having a lowest degree of structural similarity, as data of a particular part on the final reconstructed image.

Method and program for reducing artifacts by structural similarity, and medial imaging device

An X-ray imaging apparatus includes an X-ray generator configured to transmit X-rays to an object, an X-ray detector configured to detect the X-rays transmitted through the object and convert the detected X-rays into electrical signals, a gantry in which the X-ray generator and the X-ray detector are installed so as to be opposite to each other, the gantry being rotatable about a bore, a controller configured to control a rotation of the gantry during bio-signal cycles of the object so that the gantry is rotated from different start positions whenever one of the bio-signal cycles is started, and an image processor configured to generate a 4D image of the object by applying a prior image-based compressed sensing image reconstruction algorithm to plural 2D projection images acquired from the electrical signals generated by converting the X-rays detected during the rotation of the gantry.

X-ray imaging apparatus and control method thereof

Disclosed herein are an X-ray imaging apparatus and a method for the same. The X-ray imaging apparatus includes a kernel function setter configured to set a scatter kernel function in response to a scatter component included in first X-ray image data detected by an X-ray detector, and an image data corrector configured to generate second X-ray image data obtained by performing scatter correction on the first X-ray image data using the scatter kernel function and data consistency. According to the X-ray imaging apparatus and the control method for the same, scatter correction is performed by using data consistency so that accuracy of the scatter correction may be increased and an X-ray image may be generated based on the accuracy, thereby improving quality of the X-ray image.

X-ray imaging apparatus and control method for the same

Growing community of inventors

Daejeon, South Korea

Seungryong Cho