Semiconductor Components Industries, LLC

Fairchild Korea Semiconductor Ltd.

Seunghyun Hong

Kinam Song

Wonhi Oh

Jinkyu Choi

Kyu-hyun Lee

JunHo Lee

Hye-Mi Kim

Youngchul Kim

Tae-sung Kwon

Taesung Kwon

A main Insulated Gate Bipolar Transistor (IGBT) and a sense IGBT may have a sense resistor connected between a sense emitter of the sense IGBT and a main emitter of the main IGBT. Back-to-back Zener diodes may be connected between a sense gate of the sense IGBT and the sense emitter, and configured to clamp a voltage between the sense gate and the sense emitter during an electrostatic discharge (ESD) event.

Electrostatic discharge handling for sense IGBT using Zener diode

A pulse generator includes a first inverter configured to inverse an input pulse and output a result, a second inverter configured to inverse the output of the first inverter and output a result, a clamp inverter configured to generate a clamping voltage by clamping the output of the second inverter and generate an output pulse through a source follower which operates according to the clamping voltage, and a temperature compensator configured to compensate for variations in the clamping voltage caused by temperature change.

Pulse generator and driving circuit comprising the same

In a general aspect, an apparatus can include a low-side drive circuit configured to control a low-side device of a power semiconductor device pair and a high-side drive circuit configured to control a high-side device of the power semiconductor device pair. The high-side drive circuit can include an input circuit configured to receive an input signal and produce, based on the input signal, a first control signal, from which a latch set signal is produced to turn on the high-side device, and a second control signal, from which a latch reset signal is produced to turn off the high-side device. The high-side drive circuit can further include an overlap-prevention circuit configured to prevent timing overlap between the second control signal and a voltage-recovery period of the high-voltage circuit, where the voltage-recovery period occurs after turning off the high-side device of the power semiconductor device pair.

Drive circuit for power semiconductor devices

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Seoul, South Korea

Seunghyun Hong