Advanced Semiconductor Engineering, Inc.

Seungbae Park

Chin-Li Kao

Tai-Yuan Huang

Yu-Ho Hsu

The measurement equipment includes a rack, a first image capturing device, a second image capturing device, a third image capturing device and a fourth image capturing device. Wherein, the first image capturing device and the second image capturing device capture an entire image of a to-be-measured object, the third image capturing device and the fourth image capturing device capture a plurality of local images of a plurality of local areas of the to-be-measured object, and the entire image and the local images and are simultaneously captured.

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Vestal, NY, United States of America

Seungbae Park