Korea Basic Science Institute

Seung Yong Kim

Hyun Sik Kim

Mo Yang

Jong Shin Yoo

Myoung Choul Choi

Yeon Suk Choi

Jeong Min Lee

Dong Lak Kim

Hyunsik Kim

Wan Seop Jeong

Stefan Karl-Heinz Stahl

A Leum Park

Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.

Time-of-flight mass spectrometer using a cold electron beam as an ionization source

The present invention relates to an electron bean injection control of a mass spectrometer. A mass spectrometer of the present invention includes: a reference waveform generator configured to generate a reference waveform signal having one type of a square wave and a sine wave, a waveform generator configured to generate a sync signal synchronized with the reference waveform signal; an RF module configured to generate an RF voltage signal from the reference waveform signal and apply the RF voltage signal to an RF electrode in the ion trap, an electron beam generator configured to control an operation of an ultraviolet (UV) diode for generating an electron beam injected into the ion trap according to an input control signal, and a control circuit configured to generate the control signal by using the square wave signal.

Mass spectrometer and method for controlling injection of electron beam thereof

The present invention relates to a gaseous sample injection valve. The gaseous sample injection valve includes a middle body injecting a fixed amount of a gaseous sample into the vacuum chamber of a mass spectrometer, the middle body being constituted by a gaseous sample injection tube, a gaseous sample discharge tube, a storage part, and a vacuum chamber connection tube; an upper body accommodating a first solenoid coil, a first plunger, and a first packing; and a lower body accommodating a second solenoid coil, a second plunger, and a second packing. The gaseous sample injection valve according to the present invention may be miniaturized to utilize a lightweight portable mass spectrometer. Also, the vacuum pump may be reduced in load to extend the operation life-cycle of the vacuum pump. In addition, when the gaseous sample is analyzed by using the mass spectrometer, a uniform mass spectrum with respect to the gaseous sample may be obtained.

Gaseous sample injection valve and gaseous sample injection method using same

Provided is a multiple frequency Radio Frequency (RF) amplifier. The multiple frequency RF amplifier includes a waveform generation circuit configured to generate an RF signal by amplitude and frequency-modulating a reference waveform signal, a drive amplifier circuit configured to drive-amplify the RF signal, and a power amplifier circuit configured to generate a multiple frequency RF voltage signal through a power amplification of the drive-amplified RF signal and output the multiple frequency RF voltage signal to an ion trap for a mass spectrometry.

Multiple frequency RF amplifier, mass spectrometer including the same, and mass spectrometry method of mass spectrometer

The present invention relates to an ion trap mass spectrometer using a cold electron source, in a production of a portable mass spectrometer, in which a microchannel plate (MCP) module is used, initial electrons are induced by injecting ultraviolet photons emitted from an ultraviolet diode to a front surface of the MCP module, electron beams amplified from the electrons are amplified using a channeltron electron multiplier (CEM), the amplified electron beams are accurately adjusted and injected into an ion trap, thus increasing the amplification rate, and since a quadrupole field is used as an ion filter which returns the initially injected electrons to the inside of an ion trap mass separator, the ionization rate increases.

Ion trap mass spectrometer using cold electron source

A Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS) includes: an ionization source generating ions; a deceleration lens, on which the ions generated by the ionization source and spatially dispersed are incident, selectively decelerating the incident ions so as to decrease the distance between the ions; and an ion cyclotron resonance cell on which the ions passing through the deceleration lens are incident. By preventing dispersing of ions due to mass difference and converging the ions using the deceleration lens, the mass range that can be measured at one time can be extended. Also, measurement sensitivity can be improved since the ions are effectively introduced to the ICR cell.

Fourier transform ion cyclotron resonance mass spectrometer and method for concentrating ions for fourier transform ion cyclotron resonance mass spectrometry

An ion trap mass spectrometer is provided, including: an electron emitter; an ion trap storing ions generated by ionization resulting from an impact with electrons emitted from the electron emitter; a secondary ion filter for blocking out secondary ions generated due to ions selectively released by the ion trap; and a detector detecting ions selectively released from the ion trap, wherein the electron emitter, the ion trap, the secondary ion filter, and the ion detector are arranged on the same axis, so that a pure mass spectrum can be measured by excluding the secondary ions which are causes of background noise signals in the procedure of detection of the ions by the ion trap mass spectrometer.

Ion trap quadrupole mass filter

The present invention relates to an ultraviolet diode and an atomic mass analysis ionization source collecting device using an MCP. In the manufacturing of a portable atomic mass analyzer, an object of the present invention is to use an MCP electron multiplier plate, whereby ultraviolet photons emitted from an ultraviolet diode are irradiated on a front surface plate of the MCP electron multiplier plate to induce primary electrons, an amplified electron beam is collected from the electrons, and an electron beam is generated at a low temperature and low power and having a discharge time that is accurately controlled. The atomic mass analysis ionization source collecting device using an ultraviolet diode and an MCP according to the present invention comprises: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an MCP electron multiplier plate inducing and amplifying primary electron discharge from ultraviolet photons from the ultraviolet diode, and collecting a large amount of electron beams from an MCP reverse surface plate; an electron condenser lens condensing the electron beam amplified through the MCP electron multiplier plate; an ion trap atomic mass separator ionizing gas sample molecules by means of an electron beam injected through the electron condenser lens; and an ion detector performing detection of ions separated from the ion trap atomic mass separator, by means of an atomic mass spectrum.

Ultraviolet diode and atomic mass analysis ionization source collecting device using ultraviolet diode and an MCP

The present invention relates to a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, having the purpose of inducing initial electron emission using a CEM module and by radiating ultraviolet photons emitted from the ultraviolet diode to the entrance of the CEM module to obtain a large amount of amplified electron beams from the exit and to produce electron beams the emission times of which are accurately controlled at low temperature and at low power. The present invention is characterized by a device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM module, the device consisting essentially of: an ultraviolet diode emitting ultraviolet rays by means of supplied power; an electron multiplier inducing and amplifying the initial electron emission of ultraviolet photons from the ultraviolet diode and obtaining a large amount of electron beams from the exit; an electron condenser lens condensing the electron beams amplified by the electron multiplier; an ion trap mass separator ionizing gas sample molecules by the electron beams injected through the electron xondensing lens; and an ion detector detecting ions separated from the ion trap mass separator by mass spectrum, wherein the electron multiplier is a CEM module.

Device for obtaining the ion source of a mass spectrometer using an ultraviolet diode and a CEM

The present invention relates to an apparatus and method for controlling a pipeline-type ion cyclotron resonance mass spectrometer, in which an ion trap unit of the ion cyclotron resonance mass spectrometer is capable of using two digitizers at the same time, thus enabling a measurement process for detecting an electrical signal which indicates the mass of ions corresponding to a specific purpose, and another measurement process for detecting another electrical signal which indicates the mass of ions corresponding to another specific purpose, to be simultaneously performed. Accordingly, it is an aim of the present invention to provide an apparatus and method for controlling a pipeline-type ion cyclotron resonance mass spectrometer, which can overcome the problems of time delay among control procedures, and can present a signal detection step wherein an excitation electrode is utilized to improve the sensitivity and speed of signal detection.

Apparatus and method for controlling a pipeline-type ion cyclotron resonance mass spectrometer

Provided are a controller and a control method for improving signal performance of an ion cyclotron resonance mass spectrometer. The controller and control method apply electric signals for causing ions injected into an ion trap of the ion cyclotron resonance mass spectrometer to be injected to the center of the trap as close as possible to trap electrodes, and adjust biased ion motion by appropriately adjusting signals of trap electrodes for causing the injected ions to make ion motion, thereby improving the fidelity of ion signals. The control method for improving signal performance of an ion cyclotron resonance mass spectrometer includes an ion position adjustment process and an ion signal detection process.

Controller and control method for improving signal performance of ion cyclotron resonance mass spectrometer

A Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR MS) is provided. A preamplifier is installed as nearest to an ion cyclotron resonance (ICR) trap as possible at a detector part in the mass spectrometer, and thermal noise generated at the preamplifier is minimized by means of a cryo-cooling system to increase a signal-to-noise ratio of ion detection signals such that an ultra-low amount of specimen can be detected, which was impossible in the related art.

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Daejeon, South Korea

Seung Yong Kim