Korea Institute of Machinery & Materials

Seung Min Hyun

Jung Yup Kim

Jeong Hwan Kim

Jae Hyun Kim

Jun-ho Jeong

Hak-Joo Lee

Yeong-Eun Yoo

Jung Min Park

Kyung-Hyun Whang

Sung Hwan Chang

Sunghwan Chang

Hyung Cheoul Shim

Byung Ik Choi

Seung Woo Han

An exemplary embodiment of the present invention provides a manufacturing method of an electrode structure for an energy storage device, the method including: forming a polymer substrate configured to have a first uneven pattern on a first surface; forming an electrode active material layer on the first uneven pattern in a state that an tensile force is applied to the polymer substrate; and forming a second uneven pattern on the polymer substrate and the electrode active material layer by removing the tensile force.

Method for manufacturing electrode structure for flexible energy storage device, electrode structure manufactured thereby, and energy storage device including same

Disclosed is an apparatus for self-extracting a cell using a magnetic field. The apparatus for self-extracting the cell using the magnetic field according to the present invention includes a flow path casing including an upper substrate and a lower substrate having a magnetic property combined with each other, and a fluid path formed to fluidize a cell solution therein; a separation portion disposed on the fluid path and provided with a separation channel selectively passing only an effective cell that is a separation target in the cell included in the cell solution therethrough; and a magnetic field control portion forming the magnetic field in the flow path portion to separate the cell blocking the separation channel from the separation channel.

Apparatus for self-extracting cells using magnetic field and method for self-extracting cells using the same

Disclosed is an atomic force microscope (AFM) probe for use in an AFM, and more particularly, an AFM probe suitable for testing the topography and mechanical properties of a microstructure having a size on the order of micrometers or nanometers. To this end, an AFM probe according to the present invention comprises an elastically deformable frame having a fixed end and a movable end on one axis; an AFM tip supported by the movable end to be movable against a test sample in a direction of the axis; and a stopper provided on an inner surface of the frame to control a movement of the AFM tip within a predetermined range.

AFM probe with variable stiffness

Growing community of inventors

Daejeon, South Korea

Seung Min Hyun