Samsung Electronics Co., Ltd.

Other

Seung Jin Park

Jung Hwan Choi

Young Chul Cho

Young Don Choi

Jae Woo Park

Hyeok Jun Choi

A memory device in which reliability of a clock signal is improved is provided. The memory device comprises a data module including a clock signal generator configured to receive an internal clock signal from a buffer, and to generate a first internal clock signal, a second internal clock signal, a third internal clock signal, and a fourth internal clock signal having different phases, on the basis of the internal clock signal, and a first data signal generator configured to generate a first data signal on the basis of first data and the first internal clock signal, generate a second data signal on the basis of second data and the second internal clock signal, generate a third data signal on the basis of third data and the third internal clock signal, and generate a fourth data signal on the basis of fourth data and the fourth internal clock signal.

Memory device, operating method of the memory device and memory system comprising the memory device

Disclosed herein are drying system and method for restoring clothes shrunk after washing and drying of the clothes. The clothes drying system includes: an air injection part for injecting air into the drying system; a drying tube of which the volume is expandable by the air injected through the air injection part; a jig put on the outer surface of the drying tube; and a fixing part attached to the clothes and fixing the clothes and jig so that the clothes put on the outer surface of the jig is not shrunk while being dried.

Systems and methods for restoring shrunken garments

Growing community of inventors

Hwaseong-si, South Korea

Seung Jin Park