Adv Antest Corporation

Nextest Systems Corporation

Seth W Craighead

Mei-Mei Su

Srdjan Malisic

Chi Yuan

Steven R Bristow

Paul Magliocco

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a flexible sideband support system comprises a load board, testing electronics coupled to the load board, a controller coupled to the testing electronics. The load board is configured to couple with a plurality of devices under test (DUTs), wherein the load board includes in-band testing ports and sideband testing ports. The testing electronics is configured to test the plurality of DUTs, wherein a portion of testing electronics are organized in sideband resource groups. The controller is configured to direct testing of the DUTs, wherein the controller is coupled to the testing electronics and the controller directs selective allocation of the testing electronics in the sideband resource groups to various testing operations of the DUTs. In one exemplary implementation, the controller directs a portion of sideband testing of a plurality of DUTs concurrently.

Flexible sideband support systems and methods

Presented embodiments facilitate efficient and effective diagnostic of test system operations, including temperature control of test equipment components. In one embodiment a test equipment diagnostic method includes applying a known/expected first bit pattern to a test equipment component, applying a known/expected second bit pattern to a test equipment component, and performing a test equipment temperature control analysis based upon the results of applying the known/expected first bit pattern and known/expected second bit pattern. The first bit pattern and second bit pattern have known/expected respective thermal loads and corresponding respective first known/expected/expected temperature and second known/expected/expected temperature. In one embodiment, performing a test equipment temperature control analysis includes determining if temperature control components control a temperature of the test equipment component within acceptable tolerances. In one exemplary implementation, the test equipment component is a test control component (e.g., a field programmable gate array (FPGA), etc.).

Test equipment diagnostics systems and methods

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a tester system diagnostic method includes forwarding test signals to a loopback component; receiving the test signals from the loopback component; and analyzing the test signals to diagnose whether or not the test system is experiencing problems associated with electrostatic discharges, including analysis of eye scan configuration data corresponding to characteristics of the test signals. In one exemplary implementation, analyzing the eye scan configuration data, including analyzing symmetry of a graphical representation (e.g., eye pattern, eye diagram, etc.) of the eye scan configuration data with respect to a horizontal graphical representation axis.

Enhanced loopback diagnostic systems and methods

A method and apparatus are provided for high speed testing of devices having either logic circuits, memory arrays or both. Apparatus ( ) includes: (i) pin electronics (P/Es ) each coupling the apparatus to one of a number of pins ( ) on device ( ); (ii) timing and format circuits (T/Fs ) for mapping a signal to one of P/Es ( ); (iii) pattern generator ( ) having a number of outputs for outputting signals for testing device ( ); (iv) pin scrambling circuit ( ) between pattern generator ( ) and T/Fs ( ), the pin scrambling circuit capable of mapping at least two signals from any of the pattern generator outputs to any of the T/Fs; and (v) clock ( ) for providing a clock signal having a clock cycle to pattern generator ( ) and T/Fs ( ). T/Fs ( ) are capable of switching the signals coupled to P/Es ( ) at least twice each clock cycle.

Growing community of inventors

San Jose, CA, United States of America

Seth W Craighead